Nanoscale EELS analysis of elemental distribution and band-gap properties in AlGaN epitaxial layers
Nanoscale EELS analysis of elemental distribution and band-gap properties in AlGaN epitaxial layers
复制标题
AlGaN 外延层中元素分布和带隙特性的纳米级 EELS 分析
DOI:
10.1088/1742-6596/326/1/012039
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发表时间:
2011
期刊:
影响因子:
--
通讯作者:
Amari H
中科院分区:
文献类型:
--
作者:
Amari H
Aluminium gallium nitride (AlGaN) is a strong candidate for high-power and high-temperature electronic devices and short-wavelength (visible and ultraviolet) optoelectronic devices. For band-gap engineering of nitride layers, it is essential to be able to perform an accurate local measurement of their optical properties. In this work, core-loss electron energy loss spectroscopy (EELS), plasmon spectroscopy and valence EELS (VEELS) are compared for the investigation of the local chemistry and band-gap of AlGaN.
影响因子:
4
作者:
Gass, MH;Papworth, AJ;Chalker, PR
通讯作者:
Chalker, PR
DOI:
10.1557/proc-449-149
发表时间:
1996
期刊:
MRS Proceedings
影响因子:
--
作者:
H. Riechert;R. Averbeck;A. Graber;M. Schienle;U. Strauβ;H. Tews
通讯作者:
H. Tews
DOI:
10.1007/bf01394892
发表时间:
1969
期刊:
Zeitschrift für Physik A Hadrons and nuclei
影响因子:
--
作者:
C. Festenberg
通讯作者:
C. Festenberg