Impact of Soft Errors on Large-Scale FPGA Cloud Computing

Impact of Soft Errors on Large-Scale FPGA Cloud Computing
复制标题

软错误对大规模 FPGA 云计算的影响

DOI:
10.1145/3289602.3293911
复制
发表时间:
2019
期刊:
FPGA '19 Proceedings of the 2019 ACM/SIGDA International Symposium on Field-Programmable Gate Arrays
影响因子:
--
通讯作者:
Wirthlin, Michael J.
Wirthlin, Michael J.
中科院分区:
--
文献类型:
--
作者:
Keller, Andrew M.;Wirthlin, Michael J.

文献摘要

参考文献

被引文献

相似文献

FPGA在云计算中被大量使用,为传统计算结构提供高性能、低功耗的替代方案。虽然FPGA为云计算环境提供了许多重要的好处,但它们容易受到辐射引起的软错误的影响,这可能导致无声的数据损坏或系统不稳定。虽然单个FPGA内的软错误很少发生,但大规模FPGA系统中的软错误可能以相对较高的速率发生。本文研究了几个FPGA云计算节点内运行的FPGA应用程序的故障率进行故障注入实验,以确定这些应用程序的软错误的敏感性。这些实验的结果表明,在100,000节点的FPGA系统中,每隔几个小时就会发生无声数据损坏,并且这种系统只能在短时间内保持高水平的可靠性。这些结果表明,软错误检测和缓解技术可能需要在大规模FPGA系统。
FPGAs are being used in large numbers within cloud computing to provide high-performance, low-power alternatives to more traditional computing structures. While FPGAs provide a number of important benefits to cloud computing environments, they are susceptible to radiation-induced soft errors, which can lead to silent data corruption or system instability. Although soft errors within a single FPGA occur infrequently, soft errors in large-scale FPGAs systems can occur at a relatively high rate. This paper investigates the failure rate of several FPGA applications running within an FPGA cloud computing node by performing fault injection experiments to determine the susceptibility of these applications to soft-errors. The results from these experiments suggest that silent data corruption will occur every few hours within a 100,000 node FPGA system and that such a system can only maintain high-levels of reliability for short periods of operation. These results suggest that soft-error detection and mitigation techniques may be needed in large-scale FPGA systems.
DOI: 10.1109/dsn.2008.4630080
发表时间: 2008
期刊: 2008 IEEE International Conference on Dependable Systems and Networks With FTCS and DCC (DSN)
影响因子: --
作者:
Pradeep Ramachandran;P. Kudva;J. W. Kellington;J. Schumann;P. Sanda
通讯作者: P. Sanda
DOI: 10.1109/tns.2004.827944
发表时间: 2003-12
影响因子: 1.8
作者:
M. Ceschia;M. Violante;M. Sonza-Reorda;A. Paccagnella;P. Bernardi;M. Rebaudengo;D. Bortolato;M. Bellato;P. Zambolin;A. Candelori
通讯作者: M. Ceschia;M. Violante;M. Sonza-Reorda;A. Paccagnella;P. Bernardi;M. Rebaudengo;D. Bortolato;M. Bellato;P. Zambolin;A. Candelori
可靠互联网核心路由器中软错误性能的规范和验证
DOI: 10.1109/tns.2008.2001742
发表时间: 2008
影响因子: 1.8
作者:
Allan L. Silburt;Adrian Evans;Ana H. Burghelea;Shi;D. Ward;R. Norrish;D. Hogle
通讯作者: D. Hogle
DOI: 10.1109/samos.2017.8344641
发表时间: 2017
期刊: 2017 International Conference on Embedded Computer Systems: Architectures, Modeling, and Simulation (SAMOS)
影响因子: --
作者:
I. Stamoulias;C. Kachris;D. Soudris
通讯作者: D. Soudris
DOI: 10.1109/jproc.2015.2404212
发表时间: 2015-03-01
影响因子: 20.6
作者:
Wirthlin, Michael
通讯作者: Wirthlin, Michael