Ultrafast carrier dynamics in undoped and p-doped InAs/GaAs quantum dots characterized by pump-probe reflection measurements
Ultrafast carrier dynamics in undoped and p-doped InAs/GaAs quantum dots characterized by pump-probe reflection measurements
复制标题
通过泵浦探针反射测量表征未掺杂和 p 掺杂 InAs/GaAs 量子点的超快载流子动力学
DOI:
10.1063/1.2913316
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发表时间:
2008-04
影响因子:
3.2
通讯作者:
Lan, Sheng
中科院分区:
文献类型:
--
作者:
Liu, Song-Hao;Liu, Hai-Ying;Dai, Qiao-Feng;Meng, Zi-Ming;Wu, Li-Jun;Yang, Tao;Guo, Qi;Hu, Wei;Lan, Sheng
We investigate the dependence of the differential reflection on the structure parameters of quantum dot (QD) heterostructures in pump-probe reflection measurements by both numerical simulations based on the finite-difference time-domain technique and theoretical calculations based on the theory of dielectric films. It is revealed that the value and sign of the differential reflection strongly depend on the thickness of the cap layer and the QD layer. In addition, a comparison between the carrier dynamics in undoped and p-doped InAs∕GaAs QDs is carried out by pump-probe reflection measurements. The carrier capture time from the GaAs barrier into the InAs wetting layer and that from the InAs wetting layer into the InAs QDs are extracted by appropriately fitting differential reflection spectra. Moreover, the dependence of the carrier dynamics on the injected carrier density is identified. A detailed analysis of the carrier dynamics in the undoped and p-doped QDs based on the differential reflection spectra i...
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通讯作者:
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DOI:
10.1016/s1386-9477(02)00513-1
发表时间:
2002-10
影响因子:
3.3
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