MVP: Minimum-Violations Partitioning for Reducing Capture Power in At-Speed Delay-Fault Testing
MVP: Minimum-Violations Partitioning for Reducing Capture Power in At-Speed Delay-Fault Testing
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MVP：用于降低全速延迟故障测试中捕获功率的最小违规分区
DOI：
10.1109/tcad.2011.2162237
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发表时间：
2011-11
影响因子：
2.9
通讯作者：
Xiang, Dong
中科院分区：
文献类型：
--
作者：
Chen, Zhen;Chakrabarty, Krishnendu;Xiang, Dong
通过在每个移位周期中仅激活扫描单元的子集，可以降低扫描移位功率。与降低功率相反，仅使用一部分扫描单元在周期中捕获响应可能会导致捕获违规，从而导致FA
Scan shift power can be reduced by activating only a subset of scan cells in each shift cycle. In contrast to shift power reduction, the use of only a subset of scan cells to capture responses in a cycle may cause capture violations, thereby leading to fault coverage loss. In order to restore the original fault coverage, new test patterns must be generated, leading to higher test-data volume. In this paper, we propose minimum-violations partitioning, a scan-cell clustering method that can support multiple capture cycles in delay testing without increasing test-data volume. This method is based on an integer linear programming model and it can cluster the scan flip-flops into balanced parts with minimum capture violations. Based on this approach, hierarchical partitioning is proposed to make the partitioning method routing-aware. Experimental results on ISCAS'89 and IWLS'05 benchmark circuits demonstrate the effectiveness of our method.
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DOI：
10.1109/43.45867
发表时间：
1990-04
期刊：
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
影响因子：
--
作者：
L. Pileggi;R. Rohrer
通讯作者：
L. Pileggi;R. Rohrer
DOI：
10.1109/test.2007.4437633
发表时间：
2007-10
期刊：
2007 IEEE International Test Conference
影响因子：
--
作者：
Qiang Xu;D. Hu;D. Xiang
通讯作者：
Qiang Xu;D. Hu;D. Xiang
影响因子：
1.1
作者：
RAGHAVAN, P;THOMPSON, CD
通讯作者：
THOMPSON, CD
DOI：
10.1109/delta.2004.10009
发表时间：
2004-01
期刊：
Proceedings. DELTA 2004. Second IEEE International Workshop on Electronic Design, Test and Applications
影响因子：
--
作者：
Y. Bonhomme;P. Girard;L. Guiller;C. Landrault;S. Pravossoudovitch;A. Virazel
通讯作者：
Y. Bonhomme;P. Girard;L. Guiller;C. Landrault;S. Pravossoudovitch;A. Virazel
DOI：
10.1109/test.2005.1584068
发表时间：
2005-11
期刊：
IEEE International Conference on Test, 2005.
影响因子：
--
作者：
X. Wen;Yoshiyuki Yamashita;Shohei Morishima;S. Kajihara;Laung-Terng Wang;K. Saluja;K. Kinoshita
通讯作者：
X. Wen;Yoshiyuki Yamashita;Shohei Morishima;S. Kajihara;Laung-Terng Wang;K. Saluja;K. Kinoshita