Controlled and permanent induced Fermi shifts and upwards band bending in ZnO nanorods by surface stripping with argon bombardment

Controlled and permanent induced Fermi shifts and upwards band bending in ZnO nanorods by surface stripping with argon bombardment
复制标题

通过氩轰击表面剥离控制 ZnO 纳米棒中的永久诱导费米位移和向上能带弯曲

DOI:
10.1016/j.matlet.2021.130288
复制
发表时间:
2021
期刊:
影响因子:
3
通讯作者:
Barnett C
Barnett C
中科院分区:
材料科学3区
文献类型:
--
作者:
Barnett C

文献摘要

参考文献

相似文献

优化的ZnO纳米棒特性对于新型器件的有效运行至关重要,特别是将n型性质转变为本征或p型。利用XPS研究了氩气轰击不同时间对ZnO纳米棒表面化学和费米能级的影响。5 keV的轰击去除了由无定形碳和OH-、H2O和C-O基团引起的表面污染。轰击也导致O 1 s,Zn 2 p和价带转移到较低的结合能,表明转向本征行为。轰击时间可用于实现高达0.8eV的偏移,并且该偏移在纳米棒通过暴露于环境条件28天而被重新污染之后保持。这些结果表明,氩气轰击可以永久地将ZnO的n型性质转变为本征性质,以用于新型器件。
Optimised ZnO nanorod characteristics are essential for novel devices to operate efficiently, especially shifting the n-type nature towards intrinsic or p-type. The effects of argon bombardment for varying amounts of time on the surface chemistry and Fermi level of ZnO nanorods have been studied using XPS. Bombardment at 5 keV removed surface contamination caused by amorphous carbon and OH−, H2O and C-O groups. The bombardment also causes the O1s, Zn2p and valence band to shift to lower binding energies, indicating a shift towards intrinsic behaviour. Bombardment time can be used to effect a shift of up to 0.8 eV, and this shift remains after the nanorods were re-contaminated by exposure to ambient conditions for 28 days. These results indicate that argon bombardment can permanently shift the n-type nature of ZnO to intrinsic for use in novel devices.
DOI: 10.1063/1.4973487
发表时间: 2017-01-14
影响因子: 3.2
作者:
Hyland, A. M.;Makin, R. A.;Allen, M. W.
通讯作者: Allen, M. W.
通过低剂量氩离子轰击清洁硅表面以进行低温(750°C)外延硅沉积 I. 工艺注意事项。
DOI: --
发表时间: 1987
期刊:
影响因子: --
作者:
J. Comfort;L. Garverick;R. Reif
通讯作者: R. Reif
芳基重氮离子接枝后 ZnO 表面电子变化的同步辐射 X 射线光电子能谱研究:金属到绝缘体的转变
DOI: --
发表时间: 2018
期刊:
影响因子: --
作者:
A. R. McNeill;Kalib J. Bell;A. R. Hyndman;R. M. Gazoni;R. Reeves;A. Downard;M. Allen
通讯作者: M. Allen
DOI: 10.1016/j.susc.2011.09.007
发表时间: 2012-01-01
期刊: SURFACE SCIENCE
影响因子: 1.9
作者:
Maffeis, T. G. G.;Penny, M. W.;Wilks, S. P.
通讯作者: Wilks, S. P.
DOI: 10.1021/acs.jpclett.8b03286
发表时间: 2019-02-07
影响因子: 5.7
作者:
Kennedy, Oscar W.;White, Edward R.;Shaffer, Milo S. P.
通讯作者: Shaffer, Milo S. P.