Testbeam studies on pick-up in sensors with embedded pitch adapters
Testbeam studies on pick-up in sensors with embedded pitch adapters
复制标题
带有嵌入式节距适配器的传感器拾取的测试光束研究
DOI:
10.1016/j.nima.2018.06.079
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发表时间:
2019
期刊:
影响因子:
--
通讯作者:
Rehnisch L
中科院分区:
文献类型:
--
作者:
Rehnisch L
Embedded pitch adapters are an alternative solution to external pitch adapters widely used to facilitate the wire-bonding step when connecting silicon strip sensors and readout electronics of different pitch. The pad-pitch adaption can be moved into the sensor fabrication step by implementing a second layer of metal tracks, connected by vias to the primary metal layer of sensor strips. Such a solution, however, might bear the risk of performance losses introduced by various phenomena. One of these effects, the undesired capacitive coupling between the silicon bulk and this second metal layer (pick-up) has been investigated in photon testbeam measurements. For a worst-case embedded pitch adapter design, expected to be maximally susceptible to pick-up, a qualitative analysis has visualised the effect as a function of the location on the second metal layer structure. It was further found that the unwanted effect decreases towards expected values for operating thresholds of the binary readout used. Suggestions for more in-depth and quantitative studies are also derived.
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DOI:
10.1016/j.nima.2016.07.023
发表时间:
2016
期刊:
Accelerators, Spectrometers, Detectors and Associated Equipment
影响因子:
--
作者:
Benítez V
通讯作者:
Benítez V
DOI:
10.1016/j.nima.2013.07.078
发表时间:
2013
影响因子:
1.4
作者:
M. Ullán;V. Benitez;G. Pellegrini;C. Fleta;M. Lozano;C. Lacasta;U. Soldevila;C. García
通讯作者:
C. García
影响因子:
1.3
作者:
S. Kuehn;V. Benitez;J. Fernandez;C. Fleta;M. Lozano;M. Ullán;H. Lacker;L. Rehnisch;D. Sperlich;D. Ariza;I. Bloch;S. Díez;I. Gregor;J. Keller;K. Lohwasser;L. Poley;V. Prahl;N. Zakharchuk;M. Hauser;K. Jakobs;K. Mahboubi;R. Mori;U. Parzefall;J. Bernabeu;C. Lacasta;R. Marco;D. Santoyo;C. S. Contell;U. S. Serrano;T. Affolder;A. Greenall;B. Gallop;P. Phillips
通讯作者:
P. Phillips
DOI:
--
发表时间:
2016
期刊:
影响因子:
--
作者:
M. Ullán;P. Allport;M. Baca;J. Broughton;A. Chisholm;K. Nikolopoulos;S. Pyatt;J. Thomas;J. Wilson;J. Kierstead;P. Kuczewski;D. Lynn;L. Hommels;C. Fleta;J. Fernandez;D. Quirion;I. Bloch;S. Díez;I. Gregor;K. Lohwasser;L. Poley;K. Tackmann;M. Hauser;K. Jakobs;S. Kuehn;K. Mahboubi;R. Mori;U. Parzefall;A. Clark;D. Ferrere;S. Sevilla;J. Ashby;A. Blue;R. Bates;C. Buttar;F. Doherty;T. Mcmullen;F. Mcewan;V. O’Shea;S. Kamada;K. Yamamura;Y. Ikegami;K. Nakamura;Y. Takubo;Y. Unno;R. Takashima;A. Chilingarov;H. Fox;A. Affolder;G. Casse;P. Dervan;D. Forshaw;A. Greenall;S. Wonsak;M. Wormald;V. Cindro;G. Kramberger;I. Mandić;M. Mikuž;I. Gorelov;M. Hoeferkamp;P. Palni;S. Seidel;A. Taylor;K. Toms;R. Wang;N. Hessey;N. Valencic;K. Hanagaki;K. Hanagaki;Z. Doležal;P. Kodyš;J. Bohm;M. Mikestikova;A. Bevan;G. Beck;C. Milke;M. Domingo;V. Fadeyev;Z. Galloway;D. Hibbard;Zhijun Liang;H. Sadrozinski;A. Seiden;K. To;R. French;P. Hodgson;H. Marin;K. Parker;O. Jinnouchi;K. Hara;J. Bernabeu;J. V. Civera;C. García;C. Lacasta;S. Garcia;D. Rodriguez;D. Santoyo;C. Solaz;U. Soldevila
通讯作者:
U. Soldevila
DOI:
--
发表时间:
2009
期刊:
2009 IEEE Nuclear Science Symposium Conference Record (NSS/MIC)
影响因子:
--
作者:
W. Dąbrowski;F. Anghinolfi;N. Dressnandt;M. Dwuznik;S. Gonzalez;J. Kapłon;D. Marra;M. Newcomer;S. Pernecker;K. Poltorak;K. Swientek
通讯作者:
K. Swientek