Testbeam studies on pick-up in sensors with embedded pitch adapters

Testbeam studies on pick-up in sensors with embedded pitch adapters
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带有嵌入式节距适配器的传感器拾取的测试光束研究

DOI:
10.1016/j.nima.2018.06.079
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发表时间:
2019
期刊:
Accelerators, Spectrometers, Detectors and Associated Equipment
影响因子:
--
通讯作者:
Rehnisch L
Rehnisch L
中科院分区:
--
文献类型:
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作者:
Rehnisch L

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嵌入式螺距适配器是外部螺距适配器的另一种解决方案,广泛用于连接不同螺距的硅片传感器和读出电子设备时,方便线键合步骤。通过实施第二层金属轨道,通过通孔连接到传感器条的初级金属层,可以将垫距自适应移动到传感器制造步骤中。但是,这种解决方案可能会承担各种现象带来的性能损失的风险。在光子测试束测量中,研究了硅本体与第二金属层(拾取层)之间的容性耦合。对于最坏情况下的嵌入式螺距适配器设计,预计最容易拾取,定性分析将效果可视化为第二金属层结构上位置的函数。进一步发现,所使用的二进制读出的操作阈值的预期值减少了不必要的影响。并提出了进一步深入定量研究的建议。
Embedded pitch adapters are an alternative solution to external pitch adapters widely used to facilitate the wire-bonding step when connecting silicon strip sensors and readout electronics of different pitch. The pad-pitch adaption can be moved into the sensor fabrication step by implementing a second layer of metal tracks, connected by vias to the primary metal layer of sensor strips. Such a solution, however, might bear the risk of performance losses introduced by various phenomena. One of these effects, the undesired capacitive coupling between the silicon bulk and this second metal layer (pick-up) has been investigated in photon testbeam measurements. For a worst-case embedded pitch adapter design, expected to be maximally susceptible to pick-up, a qualitative analysis has visualised the effect as a function of the location on the second metal layer structure. It was further found that the unwanted effect decreases towards expected values for operating thresholds of the binary readout used. Suggestions for more in-depth and quantitative studies are also derived.
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