Development of gas cluster ion beam irradiation system with an orthogonal acceleration TOF instrument-猫眼课题宝

正交加速TOF仪器气体团簇离子束辐照系统的研制

DOI：

10.1002/sia.5092

发表时间：

2013

期刊：

Surface and Interface Analysis

影响因子：

1.7

通讯作者：

中科院分区：

化学4区

文献类型：

作者：

K.Ichiki;J. Tamura;T. Seki;T. Aoki and J. Matsuo

气体团簇离子束 (GCIB) 辐照对生物分子造成的表面损伤明显低于原子束或小团簇离子束，因此二次离子质谱 (SIMS) 等表面分析技术已成为 GCIB 最重要的应用之一，特别是对于生物分子物种的微尺度化学成像。由于飞行时间 (TOF)-SIMS 的占空比较低，只有不到 0.1% 的入射离子束用于分析，这意味着高空间分辨率的分析实际上可能会非常漫长。使用正交加速 (oa) TOF 方法可以显着提高占空比，因为使用这种方法可以以高质量分辨率测量二次离子质谱，而无需脉冲一次离子束。在本研究中，我们开发了一种安装在 oa-TOF 仪器上的气体团簇离子辐照系统，并研究了精氨酸的溅射产率和二次离子产率。版权所有 © 2012 约翰·威利父子有限公司

Surface damage induced on biomolecules with gas cluster ion beam (GCIB) irradiation is significantly lower than with atomic or small cluster ion beams, and for this reason, surface analysis techniques such as secondary ion mass spectrometry (SIMS) have become one of the most important applications of GCIB, particularly for microscale chemical imaging of biomolecular species. Because of the low duty‐cycle in time‐of‐flight (TOF)‐SIMS, only less than 0.1 % of the incident ion beam is used for analysis, meaning that analysis with high spatial resolution can practically be extremely lengthy. The duty cycle can be significantly improved with the orthogonal acceleration (oa) TOF method because with this method secondary ion mass spectra can be measured at high mass resolution without requiring a pulsed primary ion beam. In this study, we developed a gas cluster ion irradiation system mounted on an oa‐TOF instrument and investigated the sputtering yield and secondary ion yield of arginine. Copyright © 2012 John Wiley & Sons, Ltd.