Low-temperature internal quantum efficiency of GaInN/GaN quantum wells under steady-state conditions

Low-temperature internal quantum efficiency of GaInN/GaN quantum wells under steady-state conditions
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稳态条件下GaInN/GaN量子阱的低温内量子效率

DOI:
10.1088/1361-6641/ac4b89
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发表时间:
2022
影响因子:
1.9
通讯作者:
A. Hangleiter
A. Hangleiter
中科院分区:
工程技术4区
文献类型:
--
作者:
S. Sidikejiang;P. Henning;P. Horenburg;H. Bremers;U. Rossow;D. Menzel;A. Hangleiter

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我们比较了在相同激发条件下一系列GaInN/GaN量子阱(QW)结构的低温光致发光(PL)强度,并排安装样品。将测量强度归一化为量子阱中吸收功率密度,我们发现几个样品的低温PL效率在时间分辨PL中显示接近100%的内部量子效率(IQE),在几乎相同的值上饱和。当然,对于那些高效样品来说,这是在低温下100% IQE的有力指示。另一方面,利用低温发光效率作为“参考”,我们不仅观察到与温度无关的非辐射损耗对低温IQE的影响,而且能够在绝对尺度上确定任意样品的IQE。此外,我们还通过比较初始IQE为100%的样品在注入氩气后的低温效率来证明实验结果。
We compare the low-temperature photoluminescence (PL) intensities of a range of GaInN/GaN quantum well (QW) structures under identical excitation conditions, mounting the samples side by side. Normalizing the measured intensity to the absorbed power density in the QWs, we find that low-temperature PL efficiencies of several samples, which show close to 100% internal quantum efficiency (IQE) in time-resolved PL, saturate at nearly an identical value. Of course, this is strong indicative of being 100% IQE at low temperature for those efficient samples. Using the low-temperature PL efficiency as a'Reference', on the other hand, we observe not only the effects of temperature-independent non-radiative losses on the low-temperature IQE, but also are able to determine the IQE of arbitrary samples on an absolute scale. Furthermore, we prove the experimental results by comparing the low-temperature efficiencies of a sample with an initial 100% IQE after intentionally introducing structural defects with argon-implantation.
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