Observation of phonon modes in epitaxial PbTe films grown by molecular beam epitaxy

Observation of phonon modes in epitaxial PbTe films grown by molecular beam epitaxy
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分子束外延生长的外延 PbTe 薄膜中声子模式的观察

DOI:
10.1063/1.2714682
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发表时间:
2007-05
影响因子:
3.2
通讯作者:
--
中科院分区:
物理与天体物理3区
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--
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用微拉曼散射研究了分子束外延生长的PbTe薄膜的声子模。在原始生长的PbTe表面,检测到了较强的TeO2声子振动模,这掩盖了早期常规拉曼散射实验中对PbTe纵向光学声子的观测。X射线光电子能谱观察证实了PbTe表面存在TeO2层。通过化学腐蚀去除TeO2后,清晰地观察到了PbTe薄膜的LO声子。外延薄膜中的失配应变使晶格从立方结构扭曲,降低了晶体的对称性,并导致了PbTe的喇曼失活LO声子模的观察。
Phonon modes of PbTe films grown by molecular beam epitaxy have been studied by micro-Raman scattering. On the as-grown PbTe surface, strong TeO2 phonon vibrational modes were detected, which obscured the observation of the longitudinal optical (LO) phonons of PbTe in early conventional Raman scattering experiments. Existence of a TeO2 layer on the PbTe surface is confirmed by observation with x-ray photoemission spectroscopy. After removal of TeO2 by chemical etching, the LO phonons for PbTe films were unambiguously observed. Misfit strain accommodated in the epitaxial films makes the lattice distorted from cubic structure, which lowers the crystal symmetry and leads to observation of what would normally be Raman inactive LO phonon modes for PbTe.
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