Cross-Boundary Inductive Timing Optimization for 2.5D Chiplet-Package Co-Design

Cross-Boundary Inductive Timing Optimization for 2.5D Chiplet-Package Co-Design
复制标题

2.5D Chiplet-Package 协同设计的跨界感应时序优化

DOI:
10.1145/3453688.3461505
复制
发表时间:
2021
期刊:
Great Lakes Symposium on VLSI
影响因子:
--
通讯作者:
Peng, Yarui
Peng, Yarui
中科院分区:
--
文献类型:
--
作者:
Kabir, MD Arafat;Petranovic, Dusan;Peng, Yarui

文献摘要

参考文献

被引文献

相似文献

随着2.5D集成的普及,越来越多的小芯片被集成到先进的系统级封装设计中。在这样的系统中,重分布层(RDL)导线变得更长和更密集,对系统性能的影响越来越大。然而,传统的CAD工具忽略了RDL在时序分析中的归纳影响。本文提出了我们的芯片封装协同优化流程,它可以捕获RDL电感对系统性能的影响,并自动调整IO驱动器以补偿电感开销。我们开发了提取和时序分析工具,该工具对RDL线感应时序对2.5D系统性能的影响进行建模,误差在+/-1%以内。我们的研究表明,35%的信号路径通过RDL违反时序要求,因为电感的影响,并保持未被检测到,通过只有基于RC的STA。
With the popularity of 2.5D integration, an increasing number of chiplets are integrated into advanced system-in-package designs. In such systems, redistribution layer (RDL) wires become longer and denser, with a growing impact on system performance. However, RDL inductive impacts in timing analysis are ignored by the traditional CAD tools. This paper presents our chiplet-package co-optimization flow, which can capture the RDL inductance impact on system performance and automatically adjust the IO drivers to compensate for the inductance overhead. We develop our extraction and timing analysis tool that models RDL wire inductive timing impact on 2.5D system performance within +/-1% error. Our study shows 35% signal paths through RDL violate the timing requirement because of the inductive impact, and remain undetected through only RC-based STA.
基于中介层的 2.5D 小芯片集成的架构、芯片和封装协同设计流程,实现异构 IP 重用
DOI: --
发表时间: 2020
影响因子: 2.8
作者:
Jinwoo Kim;Gauthaman Murali;Heechun Park;Eric Qin;Hyoukjun Kwon;Venkata Chaitanya Krishna Chekuri;N. Rahman;N. Dasari;Ashutosh Kumar Singh;Minah Lee;H. Torun;Kallol Roy;M. Swaminathan;S. Mukhopadhyay;T. Krishna;S. Lim
通讯作者: S. Lim
VoxHenry:体素化几何形状的 FFT 加速电感提取
DOI: --
发表时间: 2018
影响因子: 4.3
作者:
A. Yucel;Ioannis P. Georgakis;A. Polimeridis;H. Bağcı;Jacob K. White
通讯作者: Jacob K. White
DOI: --
发表时间: 2014
期刊:
影响因子: --
作者:
H. Aebischer;B. Aebischer
通讯作者: B. Aebischer
用于先进 InFO 封装的新型亚微米聚合物重新分布层技术
DOI: --
发表时间: 2018
期刊: Electronic Components and Technology Conference
影响因子: --
作者:
H. Pu;H. Kuo;C. S. Liu;Douglas Yu
通讯作者: Douglas Yu
自动生成 I/O 库,用于多个异构芯片的基于内插器的系统级封装集成
DOI: --
发表时间: 2020
期刊: IEEE Transactions on Components, Packaging, and Manufacturing Technology
影响因子: --
作者:
Minah Lee;Ashutosh Kumar Singh;H. Torun;Jinwoo Kim;S. Lim;M. Swaminathan;S. Mukhopadhyay
通讯作者: S. Mukhopadhyay