Mechanical failure modes of chronically implanted planar silicon-based neural probes for laminar recording.
Mechanical failure modes of chronically implanted planar silicon-based neural probes for laminar recording.
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基于层状硅的慢性植入平面硅探针的机械故障模式，用于层流记录。
DOI：
10.1016/j.biomaterials.2014.10.040
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发表时间：
2015-01
期刊：
影响因子：
14
通讯作者：
Cui, X. Tracy
中科院分区：
文献类型：
--
作者：
Kozai, Takashi D. Y.;Catt, Kasey;Li, Xia;Gugel, Zhannetta V.;Olafsson, Valur T.;Vazquez, Alberto L.;Cui, X. Tracy
关键词：
穿透性皮质内电极阵列纵向记录大脑活动，是基础神经科学研究和新兴临床应用的强大工具。然而，无论使用哪种技术，这些电极记录的信号都会随着时间的推移而退化。这些电极的失效机制被理解为随着时间的推移，设备的生物反应组织反应和材料失效的复杂组合。虽然脑组织和植入的神经电极之间的机械不匹配被作为慢性炎症和性能退化的来源进行了研究，但由于设备中不同材料属性和不同结构组件之间的机械不匹配而导致的电极故障仍然没有得到很好的描述。用有限元模型模拟了平面硅电极上的机械应变。本文的结果表明，金属Ir和硅之间的机械失配导致了沿两种材料边界的集中应变。这种应变进一步集中在小突起上，如平面硅电极中的电迹线。通过将单单位电生理学、诱发多单位记录、电化学阻抗谱和来自痕迹和电极部位的扫描电子显微镜与我们的建模数据相结合，这些发现在小鼠的慢性活体数据(133-189天)中得到了证实。发现了导致记录退化和/或丢失的几种长期植入的平面硅电极的机械故障模式。这些发现突出了电极阵列中各个子组件的应变和材料特性的重要性。
Penetrating intracortical electrode arrays that record brain activity longitudinally are powerful tools for basic neuroscience research and emerging clinical applications. However, regardless of the technology used, signals recorded by these electrodes degrade over time. The failure mechanisms of these electrodes are understood to be a complex combination of the biological reactive tissue response and material failure of the device over time. While mechanical mismatch between the brain tissue and implanted neural electrodes have been studied as a source of chronic inflammation and performance degradation, the electrode failure caused by mechanical mismatch between different material properties and different structural components within a device have remained poorly characterized. Using Finite Element Model (FEM) we simulate the mechanical strain on a planar silicon electrode. The results presented here demonstrate that mechanical mismatch between iridium and silicon leads to concentrated strain along the border of the two materials. This strain is further focused on small protrusions such as the electrical traces in planar silicon electrodes. These findings are confirmed with chronic in vivo data (133–189 days) in mice by correlating a combination of single-unit electrophysiology, evoked multi-unit recordings, electrochemical impedance spectroscopy, and scanning electron microscopy from traces and electrode sites with our modeling data. Several modes of mechanical failure of chronically implanted planar silicon electrodes are found that result in degradation and/or loss of recording. These findings highlight the importance of strains and material properties of various subcomponents within an electrode array.
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影响因子：
4
作者：
Chestek CA;Gilja V;Nuyujukian P;Foster JD;Fan JM;Kaufman MT;Churchland MM;Rivera-Alvidrez Z;Cunningham JP;Ryu SI;Shenoy KV
通讯作者：
Shenoy KV
影响因子：
9.5
作者：
Bally, Florence;Cheng, Kenneth;Lahann, Joerg
通讯作者：
Lahann, Joerg
影响因子：
4.6
作者：
Caixeta FV;Cornélio AM;Scheffer-Teixeira R;Ribeiro S;Tort AB
通讯作者：
Tort AB
DOI：
10.1523/jneurosci.4122-11.2012
发表时间：
2012-01-11
期刊：
The Journal of neuroscience : the official journal of the Society for Neuroscience
影响因子：
--
作者：
Belluscio MA;Mizuseki K;Schmidt R;Kempter R;Buzsáki G
通讯作者：
Buzsáki G
影响因子：
16.2
作者：
Gage, Gregory J.;Stoetzner, Colin R.;Wiltschko, Alexander B.;Berke, Joshua D.
通讯作者：
Berke, Joshua D.