Helium Ion Microscopy (HIM) for the imaging of biological samples at sub-nanometer resolution.
Helium Ion Microscopy (HIM) for the imaging of biological samples at sub-nanometer resolution.
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DOI：
10.1038/srep03514
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发表时间：
2013-12-17
影响因子：
4.6
通讯作者：
Fitzpatrick, James A. J.
中科院分区：
文献类型：
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作者：
Joens, Matthew S.;Chuong Huynh;Kasuboski, James M.;Ferranti, David;Sigal, Yury J.;Zeitvogel, Fabian;Obst, Martin;Burkhardt, Claus J.;Curran, Kevin P.;Chalasani, Sreekanth H.;Stern, Lewis A.;Goetze, Bernhard;Fitzpatrick, James A. J.
扫描电子显微镜（SEM）长期以来一直是硬材料和软材料亚微米表面超微结构成像的标准。在生物样本的情况下，它提供了对其物理结构的深刻见解。然而，软材料的SEM成像中的三个基本挑战是在高放大倍率下的有限成像分辨率、由大多数生物样品的绝缘性质引起的充电以及由重金属涂层引起的细微表面特征的损失。这些挑战最近随着氦离子显微镜（HIM）的发展而被克服，该显微镜在电荷减少、最小化样品损伤、无需金属涂层的高表面对比度、增加的景深和5埃成像分辨率方面取得了进展。我们展示了HIM的优势，生物表面成像以及比较和对比样品制备技术的影响和它们的后果亚纳米超微结构。
Scanning Electron Microscopy (SEM) has long been the standard in imaging the sub-micrometer surface ultrastructure of both hard and soft materials. In the case of biological samples, it has provided great insights into their physical architecture. However, three of the fundamental challenges in the SEM imaging of soft materials are that of limited imaging resolution at high magnification, charging caused by the insulating properties of most biological samples and the loss of subtle surface features by heavy metal coating. These challenges have recently been overcome with the development of the Helium Ion Microscope (HIM), which boasts advances in charge reduction, minimized sample damage, high surface contrast without the need for metal coating, increased depth of field, and 5 angstrom imaging resolution. We demonstrate the advantages of HIM for imaging biological surfaces as well as compare and contrast the effects of sample preparation techniques and their consequences on sub-nanometer ultrastructure.
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