AlInP X-ray photodiodes without incomplete charge collection noise

AlInP X-ray photodiodes without incomplete charge collection noise
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无不完全电荷收集噪声的 AlInP X 射线光电二极管

DOI:
10.1016/j.nima.2020.163606
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发表时间:
2020
期刊:
Accelerators, Spectrometers, Detectors and Associated Equipment
影响因子:
--
通讯作者:
Zhao S
Zhao S
中科院分区:
--
文献类型:
--
作者:
Zhao S

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摘要以前,具有2μm厚(直径200μm)的Al0.52In 0.48P p+-In+光谱光子计数X射线光电二极管被证明受到能量相关的不完全电荷收集噪声的影响(Lioliou等人,2019年)。随后对更大的(直径400μm)Al0.52In 0.48P p+-In+光电二极管的测量表明,存在更大的不完全电荷收集噪声。考虑到这些发现,一种预期是较厚的Al 0.52 In 0.48 P结构(这将是有效吸收除最软X射线之外的所有X射线所必需的)将具有更大的不完全电荷收集噪声贡献,因此表明厚Al 0.52 In 0.48 P光电二极管作为光子计数X射线光谱分析的高性能探测器的实用性可能有限。然而,两个新的Al0.52In0.48Pp+-In+光电二极管(具有6μmi层)是用相同的技术(金属有机气相外延)在同一反应堆中生长的,现在显示在4.95keV到21.17keV的X射线光子照射下没有显示出可检测到的不完全电荷收集噪声的迹象。因此,既然已经积累了更多关于Al 0.52In 0.48P的经验,对由该材料制成的X射线探测器中电荷收集不完全噪声的担忧似乎是没有根据的;迈向厚Al 0.52In 0.48P X射线探测器的道路现在是明确的。
Abstract Previously, an Al 0.52 In 0.48 P p+-in+ spectroscopic photon counting X-ray photodiode with 2 μ m thick i layer (200 μ m diameter) was shown to suffer from energy-dependent incomplete charge collection noise (Lioliou et al., 2019). Subsequent measurements on a larger (400 μ m diameter) Al 0.52 In 0.48 P p+-in+ photodiode (reported here) revealed the presence of even greater incomplete charge collection noise. Given these findings, an expectation would have been that thicker Al 0.52 In 0.48 P structures (which would be required for efficient absorption of all but the softest X-rays) would have a greater incomplete charge collection noise contribution, thus suggesting that thick Al 0.52 In 0.48 P photodiodes may be of limited practicality as high performance detectors for photon counting X-ray spectroscopy. However, two new Al 0.52 In 0.48 P p+-in+ photodiodes (with 6 μ m i layers) were fabricated from material grown by the same technique (metalorganic vapour phase epitaxy) in the same reactor, and are now shown here to exhibit no signs of detectable incomplete charge collection noise under the illumination of X-ray photons of energy 4.95 keV to 21.17 keV. As such, now that greater experience has been built with Al 0.52 In 0.48 P, concerns about incomplete charge collection noise in X-ray detectors made from the material appear to have been unwarranted; the path towards thick Al 0.52 In 0.48 P X-ray detectors is now clear.
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发表时间: 2016-07
影响因子: 3.2
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