Millimeter-Wave On-Wafer Large Signal Characterization System for Harmonic Source/Load Pull and Waveform Measurements
Millimeter-Wave On-Wafer Large Signal Characterization System for Harmonic Source/Load Pull and Waveform Measurements
复制标题
用于谐波源/负载牵引和波形测量的毫米波晶圆大信号表征系统
DOI:
10.1109/ims37964.2023.10187929
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发表时间:
2023
期刊:
影响因子:
--
通讯作者:
Baddeley A
中科院分区:
文献类型:
--
作者:
Baddeley A
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DOI:
--
发表时间:
2020
期刊:
2020 IEEE Topical Conference on RF/Microwave Power Amplifiers for Radio and Wireless Applications (PAWR)
影响因子:
--
作者:
R. Quaglia;A. Piacibello;F. Costanzo;R. Giofré;M. Casbon;R. Leblanc;V. Valenta;V. Camarchia
通讯作者:
V. Camarchia
影响因子:
5.6
作者:
V. Teppati;C. Bolognesi
通讯作者:
C. Bolognesi
DOI:
--
发表时间:
2021
期刊:
2021 IEEE Texas Symposium on Wireless and Microwave Circuits and Systems (WMCS)
影响因子:
--
作者:
Pouria Pazhouhesh;J. Kitchen
通讯作者:
J. Kitchen
影响因子:
4.3
作者:
V. Teppati;H. Benedickter;D. Marti;M. Garelli;S. Tirelli;R. Lovblom;R. Fluckiger;M. Alexandrova;O. Ostinelli;C. Bolognesi
通讯作者:
C. Bolognesi
影响因子:
4.3
作者:
C. De Martino;L. Galatro;Raffaele Romano;G. Parisi;M. Spirito
通讯作者:
M. Spirito