Radiation testing of low cost, commercial off the shelf microcontroller board
Radiation testing of low cost, commercial off the shelf microcontroller board
复制标题
低成本商用现成微控制器板的辐射测试
DOI:
10.1016/j.net.2021.05.005
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发表时间:
2021
影响因子:
2.7
通讯作者:
Fried T
中科院分区:
文献类型:
--
作者:
Fried T
The impact of gamma radiation on a commercial off the shelf microcontroller board has been investigated. Three different tests have been performed to ascertain the radiation tolerance of the device from a nuclear decommissioning deployment perspective. The first test analyses the effect of radiation on the output voltage of the on-board voltage regulator during irradiation. The second test evaluated the effect of gamma radiation on the voltage characteristics of analogue and digital inputs and outputs. The final test analyses the functionality of the microcontroller when using an external, shielded voltage regulator instead of the on-board voltage regulator. The results suggest that a series of latch-ups occurs in the microcontroller during irradiation, causing increased current drain which can damage the voltage regulator if it does not have short-circuit protection. The analogue to digital conversion functionality appears to be more sensitive to gamma radiation than digital and analogue output functionality. Using an external, shielded voltage regulator can prove beneficial when used for certain applications. The collected data suggests that detaching the voltage regulator can extend the lifespan of the platform up to approximately 350 Gy.
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DOI:
--
发表时间:
2013
期刊:
European Conference on Radiation and Its Effects on Components and Systems
影响因子:
--
作者:
Jin Xiaoming;Ma Qiang;Qi Chao;Yang Shanchao;Li Ruibin;Bai Xiaoyan;Liu Yan;Wang Guizhen;Lin Dong;Chen Wei;Ding Lili
通讯作者:
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DOI:
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2002
期刊:
IEEE Radiation Effects Data Workshop
影响因子:
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DOI:
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发表时间:
2015
期刊:
Radiation Effects Data Workshop
影响因子:
--
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通讯作者:
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影响因子:
1.8
作者:
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通讯作者:
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影响因子:
2.7
作者:
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通讯作者:
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