Low-Frequency Noise Characteristics of Zinc-Oxide-Film-Based Photoconductive Detectors
Low-Frequency Noise Characteristics of Zinc-Oxide-Film-Based Photoconductive Detectors
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氧化锌薄膜光电导探测器的低频噪声特性
DOI：
10.7567/jjap.52.084101
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发表时间：
2013-08
影响因子：
1.5
通讯作者：
Zhao, Hongwu
中科院分区：
文献类型：
--
作者：
Meng, Yang;Zhang, Peijian;Liu, Ziyu;Zhao, Hongwu
在基于 ZnO 的光电导探测器上进行低频电流噪声测量，并在黑暗和紫外线照射下观察到 1/f 噪声特性。在照明下测量的噪声比暗噪声大约高一个数量级。在较高电压范围内，观察到光电流噪声的膝状电压依赖性。增强的光电流噪声归因于晶界界面处与氧相关的空穴陷阱态的随机捕获-去捕获过程。较高电压范围内光电流噪声的反常电压依赖性表明与氧相关的空穴陷阱态存在不均匀分布。
Low-frequency current noise measurements were performed on ZnO-based photoconductive detectors, and 1/f noise characteristics were observed both in the dark and under ultraviolet illumination. The noise measured under illumination is approximately one order of magnitude higher than the dark noise. In the higher voltage range, a knee-like voltage dependence of the photocurrent noise was observed. The enhanced photocurrent noise is attributed to the random trapping–detrapping processes of the oxygen-related hole-trap states at the grain boundary interface. The anomalous voltage dependence of the photocurrent noise in the higher voltage range indicated the presence of the inhomogeneous distribution of the oxygen-related hole-trap states.
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影响因子：
29.4
作者：
Qianwang Chen;Xiaoguang Li;Yuheng Zhang;Y. Qian
通讯作者：
Qianwang Chen;Xiaoguang Li;Yuheng Zhang;Y. Qian
DOI：
10.1143/jjap.33.6611
发表时间：
1994-12-01
期刊：
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS
影响因子：
--
作者：
TAKAHASHI, Y;KANAMORI, M;OHYA, Y
通讯作者：
OHYA, Y
影响因子：
10.8
作者：
Soci, C.;Zhang, A.;Wang, D.
通讯作者：
Wang, D.
DOI：
10.1103/physrevb.49.7592
发表时间：
1994-03
期刊：
Physical review. B, Condensed matter
影响因子：
--
作者：
Carbone;Mazzetti
通讯作者：
Carbone;Mazzetti
影响因子：
3.2
作者：
D. Tassis;C. Dimitriadis;J. Brini;G. Kamarinos;A. Birbas
通讯作者：
D. Tassis;C. Dimitriadis;J. Brini;G. Kamarinos;A. Birbas