Pilot Assisted Adaptive Thresholding for Sneak-Path Mitigation in Resistive Memories With Failed Selection Devices
Pilot Assisted Adaptive Thresholding for Sneak-Path Mitigation in Resistive Memories With Failed Selection Devices
复制标题
用于缓解选择器件故障的电阻存储器中的潜行路径的引导辅助自适应阈值
DOI:
10.1109/tcomm.2019.2948332
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发表时间:
2020
影响因子:
8.3
通讯作者:
Dolecek, Lara
中科院分区:
文献类型:
--
作者:
Chen, Zehui;Schoeny, Clayton;Dolecek, Lara
Resistive random-access memory (ReRAM) with the crossbar structure is one promising candidate to be used as a next generation non-volatile memory device. In a crossbar ReRAM, in which a memristor is positioned on each row-column intersection, the sneak-path problem is one of the main challenges for a reliable readout. The sneak-path problem can be solved with additional selection devices. When some selection devices fail short, the sneak-path problem re-occurs. The re-occurred sneak-path problem is addressed in this paper. The re-occurred sneak-path event can be described combinatorially and its adverse effect can be modeled as a parallel interference. Based on a simple pilot construction, we probabilistically characterize the inter-cell dependency of the re-occurred sneak-path events. Utilizing this dependency, we propose adaptive thresholding schemes for resistive memory readout using side information provided by pilot cells. This estimation theoretic approach effectively reduces the bit-error rate while maintaining low redundancy overhead and low complexity.
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影响因子:
2.5
作者:
Yuval Cassuto;Shahar Kvatinsky;Eitan Yaakobi
通讯作者:
Yuval Cassuto;Shahar Kvatinsky;Eitan Yaakobi
DOI:
--
发表时间:
2010
期刊:
Symposium on VLSI Technology
影响因子:
--
作者:
M. Wang;W. Luo;Y. L. Wang;L. M. Yang;Wenjie Zhu;P. Zhou;J. H. Yang;X. Gong;Y. Y. Lin;R. Huang;S. Song;Q. Zhou;H. Wu;J. Wu;M. Chi
通讯作者:
M. Chi
影响因子:
8.3
作者:
Chen, Zehui;Schoeny, Clayton;Dolecek, Lara
通讯作者:
Dolecek, Lara
DOI:
--
发表时间:
2019
期刊:
IEEE Information Theory Workshop
影响因子:
--
作者:
Chen, Zehui;Schoeny, Clayton;Dolecek, Lara
通讯作者:
Dolecek, Lara