Effect of ultrathin AlN spacer on electronic properties of GaN/SiC heterojunction bipolar transistors

Effect of ultrathin AlN spacer on electronic properties of GaN/SiC heterojunction bipolar transistors
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超薄AlN间隔物对GaN/SiC异质结双极晶体管电性能的影响

DOI:
10.7567/jjap.53.034101
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发表时间:
2014
影响因子:
1.5
通讯作者:
J. Suda
J. Suda
中科院分区:
物理与天体物理4区
文献类型:
--
作者:
H. Miyake;T. Kimoto;J. Suda

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提出了在 n-GaN/p-SiC 发射极结处具有超薄 AlN 间隔层的 GaN/SiC 异质结双极晶体管 (HBT),用于控制 GaN/SiC 异质结的电子特性。由于降低了电子注入的势垒(0.54 eV)并减少了通过界面陷阱的复合,因此发现 AlN 间隔物的插入在提高电子注入效率方面很有希望。我们还研究了 AlN 生长之前预辐照活性氮原子 (N*) 对控制 GaN/AlN/SiC 异质结电子性能的影响。我们发现N*预辐照势垒进一步降低至0.46 eV。 HBT 结构是使用我们新开发的工艺成功制造的,该工艺采用离子注入和 Pd 欧姆接触,在低至 600 °C 的温度下获得与 p-SiC 基底的低接触电阻率。没有AlN层的HBT表现出较低的电流增益(α∼0.001),而GaN/AlN/SiC HBT在使用1纳米厚的AlN间隔物而没有N*预辐照的情况下表现出0.1的改善的电流增益,在使用2nm厚的AlN间隔物和N*预辐照的情况下表现出0.2的改善的电流增益。
GaN/SiC heterojunction bipolar transistors (HBTs) with an ultrathin AlN spacer layer at the n-GaN/p-SiC emitter junction are proposed for the control of the electronic properties of GaN/SiC heterojunctions. The insertion of an AlN spacer is found to be promising in terms of improving electron injection efficiency owing to the reduced potential barrier (0.54 eV) to electron injection and reduced recombination via interface traps. We also investigated the effect of pre-irradiation of active nitrogen atoms (N*) prior to AlN growth for the control of the electronic properties of GaN/AlN/SiC heterojunctions. We found that the potential barrier was further reduced to 0.46 eV by N* pre-irradiation. The HBT structure was successfully fabricated using our newly developed process featuring ion implantation and Pd ohmic contacts to obtain a low contact resistivity to a p-SiC base at a temperature as low as 600 °C. A fabricated HBT without an AlN layer showed a low current gain (α ∼ 0.001), whereas the GaN/AlN/SiC HBT showed improved current gains of 0.1 in the case of using a 1-nm-thick AlN spacer without N* pre-irradiation and 0.2 in the case of using a 2-nm-thick AlN spacer with N* pre-irradiation.
具有 AlN/GaN 短周期超晶格宽禁带发射极的 SiC 异质结双极晶体管
DOI: --
发表时间: 2010
期刊: Materials Science Forum 645-648
影响因子: --
作者:
H.Miyake;T.Kimoto;J.Suda
通讯作者: J.Suda
具有 AlN/GaN 短周期超晶格宽禁带发射极的 AlGaN/SiC 异质结双极晶体管演示
DOI: --
发表时间: 2009
期刊:
影响因子: --
作者:
H.Miyake;T.Kimoto;J.Suda
通讯作者: J.Suda
通过深度还原工艺实现创纪录电流增益的 4H-SiC 双极结晶体管
DOI: --
发表时间: 2011
期刊:
影响因子: --
作者:
H.Miyake;T.Kimoto;J.Suda
通讯作者: J.Suda