The same chemical state of carbon gives rise to two peaks in X-ray photoelectron spectroscopy.

The same chemical state of carbon gives rise to two peaks in X-ray photoelectron spectroscopy.
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DOI:
10.1038/s41598-021-90780-9
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发表时间:
2021-05-27
期刊:
影响因子:
4.6
通讯作者:
Hultman L
Hultman L
中科院分区:
综合性期刊3区
文献类型:
--
作者:
Greczynski G;Hultman L

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X射线光电子能谱(XPS)中的化学状态分析依赖于将明确定义的结合能值分配给源自特定键合构型中的原子的芯能级电子。在这里,我们提出了违反这一范式的直接证据。结果表明,由于在Al和Au箔上积累的外来碳(AdC)层的C-C/C-H键合原子的C1 s峰分裂成两个明显不同的贡献,这是由于AdC/箔界面处的真空能级对准。在同时记录两个相互电接触的金属箔的光谱时观察到了这种现象。这一发现暴露了报告的XPS数据的可靠性的基本问题,因为AdC的C1 s峰通常用于结合能标度参考。因此,应停止在XPS中使用外来碳,因为它会导致无意义的结果。因此,ISO和ASTM电荷参考指南需要重写。
Chemical state analysis in X-ray photoelectron spectroscopy (XPS) relies on assigning well-defined binding energy values to core level electrons originating from atoms in particular bonding configurations. Here, we present direct evidence for the violation of this paradigm. It is shown that the C 1s peak due to C–C/C–H bonded atoms from adventitious carbon (AdC) layers accumulating on Al and Au foils splits into two distinctly different contributions, as a result of vacuum level alignment at the AdC/foil interface. The phenomenon is observed while simultaneously recording the spectrum from two metal foils in electric contact with each other. This finding exposes fundamental problems with the reliability of reported XPS data as C 1s peak of AdC is routinely used for binding energy scale referencing. The use of adventitious carbon in XPS should thus be discontinued as it leads to nonsense results. Consequently, ISO and ASTM charge referencing guides need to be rewritten.
DOI: 10.1063/1.4968803
发表时间: 2016-11-21
影响因子: 4
作者:
Greczynski, G.;Hultman, L.
通讯作者: Hultman, L.
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发表时间: 2011-03-01
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