Effect of hydrogen flow on the properties of hydrogenated amorphous carbon films fabricated by electron cyclotron resonance plasma enhanced chemical vapor deposition
Effect of hydrogen flow on the properties of hydrogenated amorphous carbon films fabricated by electron cyclotron resonance plasma enhanced chemical vapor deposition
复制标题
氢气流量对电子回旋共振等离子体增强化学气相沉积氢化非晶碳薄膜性能的影响
DOI:
10.1016/j.surfcoat.2011.03.107
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发表时间:
2011-11
影响因子:
5.4
通讯作者:
Huang, Nan
中科院分区:
文献类型:
--
作者:
Dong, X.;Deng, X.R.;Sun, H.;Leng, Y.X.;Huang, Nan
The hydrogenated amorphous carbon films (a-C:H, so-called diamond-like carbon, DLC) have exceptional physical and mechanical properties and have wide applications. In the present study, amorphous hydrogenated carbon films (a-C:H) have been deposited on a Si (100) substrate at different hydrogen flow using electron cyclotron resonance chemical vapor deposition (ECR-CVD). The flow of hydrogen changed from 10sccm to 40sccm and the flow of acetylene was fixed at 10sccm. The microstructure and properties of the a-C:H were measured using visible Raman spectra, Fourier transform infrared (FTIR) spectroscopy, UV–VIS spectrometer,surface profilometer and nano-indentation. The results showed that the sp3content and sp3–CH2structure in the amorphous hydrogenated carbon films increased with the hydrogen flow. The deposition rate decreased with the hydrogen flow. The residual stress and the nano-hardness of the amorphous hydrogenated carbon films increased with the hydrogen flow. Consequently, the a-C:H film become more diamond-like with the increase of hydrogen flow.
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影响因子:
6.7
作者:
Leng, Y. X.;Deng, Xingrui;Xie, Dong;Liu, Hengjun;Huang, Nan
通讯作者:
Huang, Nan
影响因子:
3
作者:
W. Yang;Y. Choa;T. Sekino;K. Shim;K. Niihara;K. Auh
通讯作者:
W. Yang;Y. Choa;T. Sekino;K. Shim;K. Niihara;K. Auh
影响因子:
5.4
作者:
MIYOSHI, K;WU, RLC;GARSCADDEN, A
通讯作者:
GARSCADDEN, A
影响因子:
3.7
作者:
NICKLOW, R;SMITH, HG;WAKABAYA.N
通讯作者:
WAKABAYA.N
影响因子:
3.5
作者:
T. V. Herak;R. McLeod;K. Kao;H. Card;H. Watanabe;K. Katoh;M. Yasui;Y. Shibata
通讯作者:
T. V. Herak;R. McLeod;K. Kao;H. Card;H. Watanabe;K. Katoh;M. Yasui;Y. Shibata