Atomic layer deposition of TiO2 from tetrakis-dimethyl-amido titanium or Ti isopropoxide precursors and H2O
Atomic layer deposition of TiO2 from tetrakis-dimethyl-amido titanium or Ti isopropoxide precursors and H2O
复制标题
由四二甲基氨基钛或异丙醇钛前体和 H2O 原子层沉积 TiO2
DOI:
10.1063/1.2798384
复制
发表时间:
2007-10
影响因子:
3.2
通讯作者:
中科院分区:
文献类型:
--
作者:
Atomic layer deposition (ALD) of TiO2 thin films using Ti isopropoxide and tetrakis-dimethyl-amido titanium (TDMAT) as two kinds of Ti precursors and water as another reactant was investigated. TiO2 films with high purity can be grown in a self-limited ALD growth mode by using either Ti isopropoxide or TDMAT as Ti precursors. Different growth behaviors as a function of deposition temperature were observed. A typical growth rate curve-increased growth rate per cycle (GPC) with increasing temperatures was observed for the TiO2 film deposited by Ti isopropoxide and H2O, while surprisingly high GPC was observed at low temperatures for the TiO2 film deposited by TDMAT and H2O. An energetic model was proposed to explain the different growth behaviors with different precursors. Density functional theory (DFT) calculation was made. The GPC in the low temperature region is determined by the reaction energy barrier. From the experimental results and DFT calculation, we found that the intermediate product stability ...
登录
查看更多内容
影响因子:
4
作者:
Wei Chen;H. Lu;David-Wei Zhang;Min Xu;Jie Ren;Jian-yun Zhang;Jitao Wang;Li-Kang Wang
通讯作者:
Wei Chen;H. Lu;David-Wei Zhang;Min Xu;Jie Ren;Jian-yun Zhang;Jitao Wang;Li-Kang Wang
影响因子:
4
作者:
Y. Widjaja;C. Musgrave
通讯作者:
Y. Widjaja;C. Musgrave
影响因子:
--
作者:
Maeng, WJ;Kim, H
通讯作者:
Kim, H
影响因子:
--
作者:
J. Lim;S. Yun;J. Lee
通讯作者:
J. Lim;S. Yun;J. Lee
影响因子:
3.2
作者:
Ching‐Wu Wang;Shih-fang Chen;Guan-Ting Chen
通讯作者:
Ching‐Wu Wang;Shih-fang Chen;Guan-Ting Chen