Atomic layer deposition of TiO2 from tetrakis-dimethyl-amido titanium or Ti isopropoxide precursors and H2O

Atomic layer deposition of TiO2 from tetrakis-dimethyl-amido titanium or Ti isopropoxide precursors and H2O
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由四二甲基氨基钛或异丙醇钛前体和 H2O 原子层沉积 TiO2

DOI:
10.1063/1.2798384
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发表时间:
2007-10
影响因子:
3.2
通讯作者:
--
中科院分区:
物理与天体物理3区
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--
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研究了以异丙醇钛和四甲基二甲基胺基钛(TDMAT)为前驱体,水为另一反应物的原子层沉积(ALD)法制备二氧化钛薄膜。以异丙醇钛或TDMAT为前驱体,采用自限ALD生长模式可以生长出高纯度的TiO2膜。观察到不同的生长行为随沉积温度的变化。异丙醇钛和水沉积的二氧化钛薄膜具有典型的生长速率曲线--每周生长速率(GPC)随温度的升高而增加,而TDMAT和H2O沉积的二氧化钛薄膜在低温下的每周生长速率(GPC)令人惊讶地高。提出了一个能量模型来解释不同前驱体的不同生长行为。进行了密度泛函理论(DFT)计算。低温区的GPC由反应能垒决定。从实验结果和密度泛函理论计算中发现,中间产物的稳定性较好。
Atomic layer deposition (ALD) of TiO2 thin films using Ti isopropoxide and tetrakis-dimethyl-amido titanium (TDMAT) as two kinds of Ti precursors and water as another reactant was investigated. TiO2 films with high purity can be grown in a self-limited ALD growth mode by using either Ti isopropoxide or TDMAT as Ti precursors. Different growth behaviors as a function of deposition temperature were observed. A typical growth rate curve-increased growth rate per cycle (GPC) with increasing temperatures was observed for the TiO2 film deposited by Ti isopropoxide and H2O, while surprisingly high GPC was observed at low temperatures for the TiO2 film deposited by TDMAT and H2O. An energetic model was proposed to explain the different growth behaviors with different precursors. Density functional theory (DFT) calculation was made. The GPC in the low temperature region is determined by the reaction energy barrier. From the experimental results and DFT calculation, we found that the intermediate product stability ...
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