Silicon based in-situ measurement system for flex loads on MLCCs in PCB manufacturing chain
Silicon based in-situ measurement system for flex loads on MLCCs in PCB manufacturing chain
复制标题
PCB 制造链中 MLCC 柔性负载的硅基原位测量系统
DOI:
10.1016/j.sna.2015.06.005
复制
发表时间:
2015
影响因子:
4.6
通讯作者:
Schmidt
中科院分区:
文献类型:
--
作者:
Majcherek;Hirsch;Schmidt
A new in-situ monitoring method of mechanical loads acting on MLCC (multi layer ceramic capacitors) devices during the PCB manufacturing chain is presented in this paper. A S3MD (stresssensitivesurface mounted device) is designed as a silicon based package equivalent with strain sensitive pattern for an 0805 SMD chip device. Metal thin film resistors of Cu55Ni45 and Ni65Cr35 are used as resistive strain sensitive elements. A solderable termination is created to get the solder mounting option. Bending tests like descripted in AEC Q200 “Board Flex” were done to obtain the load limits for different MLCC termination types. Therefore a suitable PCB is designed with 4-terminal-sensing. Different bending speeds are performed to characterize the possibility to analyze creeping behavior of the solder or adhesive joint with the S3MD sensor elements. Finally a depaneling process with rotary blade is performed with an in-situ measurement of the load intensity acting on the devices during the process depending on the cutting edge distance.
登录
查看更多内容
DOI:
--
发表时间:
2013
期刊:
International Conference on Thermal, Mechanial and Multi-Physics Simulation and Experiments in Micro-Electronics and Micro-Systems
影响因子:
--
作者:
F. Schindler;F. Rost;Alexander Otto;R. Pantou;R. Mrossko;B. Wunderle;B. Michel;S. Rzepka;J. Keller
通讯作者:
J. Keller
DOI:
--
发表时间:
1973
期刊:
影响因子:
--
作者:
C. Lane
通讯作者:
C. Lane
DOI:
--
发表时间:
1993
期刊:
影响因子:
--
作者:
J. Minford
通讯作者:
J. Minford
DOI:
--
发表时间:
2013
期刊:
2013 IEEE 63rd Electronic Components and Technology Conference
影响因子:
--
作者:
T. Schreier;G. Chmiel;F. Ansorge;K. Lang
通讯作者:
K. Lang