Self-Diffusion in Amorphous Silicon.
Self-Diffusion in Amorphous Silicon.
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非晶硅中的自扩散
DOI:
10.1103/physrevlett.116.025901
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发表时间:
2016
影响因子:
8.6
通讯作者:
H. Schmidt
中科院分区:
文献类型:
--
作者:
F. Strauß;T. Geue;J. Stahn;A. Koutsioubas;S. Mattauch;H. Schmidt
The present Letter reports on self-diffusion in amorphous silicon. Experiments were done onheterostructures using neutron reflectometry and secondary ion mass spectrometry. The diffusivities follow the Arrhenius law in the temperature range between 550 andwith an activation energy of. In comparison with single crystalline silicon the diffusivities are tremendously higher by 5 orders of magnitude at about, which can be interpreted as the consequence of a high diffusion entropy.
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影响因子:
9.4
作者:
H. Schmidt;M. Gupta;T. Gutberlet;J. Stahn;M. Bruns
通讯作者:
M. Bruns
影响因子:
8.6
作者:
van den Hoven GN;Liang;Niesen;Custer
通讯作者:
Custer
DOI:
10.1016/s0168-583x(87)80086-1
发表时间:
1987-02-01
影响因子:
1.3
作者:
ELLIMAN, RG;WILLIAMS, JS;KNOELL, RV
通讯作者:
KNOELL, RV
影响因子:
--
作者:
F. Strauß;T. Geue;J. Stahn;H. Schmidt
通讯作者:
H. Schmidt
影响因子:
8.6
作者:
POLK, DE;BOUDREAUX, DS
通讯作者:
BOUDREAUX, DS