Characterization of a-plane orientation ZnO film grown on GaN/Sapphire template by pulsed laser deposition
Characterization of a-plane orientation ZnO film grown on GaN/Sapphire template by pulsed laser deposition
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通过脉冲激光沉积在 GaN/蓝宝石模板上生长 a 面取向 ZnO 薄膜的表征
DOI:
10.1016/j.apsusc.2010.02.072
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发表时间:
2010-05
影响因子:
6.7
通讯作者:
Z.H. Wu
中科院分区:
文献类型:
--
作者:
X.Y. Han;J.N. Dai;C.Q. Chen;C.H. Yu;Y.H. Gao;Z.H. Wu
In this study, the authors have investigated the structural and optical properties of ZnO layer grown by pulsed laser deposition on GaN/r-plane sapphire. X-ray diffraction results demonstrate the ZnO film to be highly preferentially deposited at a-axis orientation; the different rocking curve values along the two orthogonal directions indicate the low C2vsymmetry in the growth a-plane ZnO. From free stress to large tensile stress (about 1.34×109Pa) distribution along the growth direction of ZnO is revealed by visible Raman mapping spectra. The enhanced significantly high-order longitudinal-optical (LO) phonon modes up to 4th and no TO phonons have been observed in Raman spectrum under UV 325nm by resonance conditions; an intense and broad disorder activated surface phonon mode is also observed, resulting from the increased disorder on the film surface with stripe-like growth features. Low-temperature photoluminescence measurements reveal that the band-edge emission of ZnO is dominated by neutral donor-bound exciton and free electrons to neutral acceptor emissions. Interfacial microstructure of ZnO/GaN has been examined by transmission electron microscopy, with the epitaxial relationship (101¯0) ZnO//(0002¯) GaN. All these results indicated that GaN template played an important role in the growth of ZnO film, with full advantage of small lattice mismatch.
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通讯作者:
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通讯作者:
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