Characterization of a-plane orientation ZnO film grown on GaN/Sapphire template by pulsed laser deposition

Characterization of a-plane orientation ZnO film grown on GaN/Sapphire template by pulsed laser deposition
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通过脉冲激光沉积在 GaN/蓝宝石模板上生长 a 面取向 ZnO 薄膜的表征

DOI:
10.1016/j.apsusc.2010.02.072
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发表时间:
2010-05
影响因子:
6.7
通讯作者:
Z.H. Wu
Z.H. Wu
中科院分区:
材料科学1区
文献类型:
--
作者:
X.Y. Han;J.N. Dai;C.Q. Chen;C.H. Yu;Y.H. Gao;Z.H. Wu

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在本研究中,作者研究了脉冲激光沉积在GaN/r平面蓝宝石上生长的ZnO层的结构和光学性质。x射线衍射结果表明,ZnO薄膜在a轴取向高度优先沉积;两个正交方向上不同的摇摆曲线值表明生长平面ZnO具有较低的c2v对称性。从自由应力到大拉应力(约1.34×109Pa)沿ZnO生长方向的分布由可见拉曼映射光谱揭示。在325nm紫外光下,在拉曼光谱中观察到高阶纵向光学(LO)声子模式显著增强至4阶,无to声子模式;由于具有条纹状生长特征的薄膜表面的无序性增加,还观察到强烈而广泛的无序激活表面声子模式。低温光致发光测量表明,ZnO的带边发射主要是中性供体束缚激子和自由电子向中性受体发射。通过透射电镜观察ZnO/GaN的界面微观结构,发现ZnO/GaN的外延关系为(101¯0)ZnO//(0002¯)GaN。这些结果表明,GaN模板在ZnO薄膜的生长中发挥了重要作用,充分利用了小晶格失配的优势。
In this study, the authors have investigated the structural and optical properties of ZnO layer grown by pulsed laser deposition on GaN/r-plane sapphire. X-ray diffraction results demonstrate the ZnO film to be highly preferentially deposited at a-axis orientation; the different rocking curve values along the two orthogonal directions indicate the low C2vsymmetry in the growth a-plane ZnO. From free stress to large tensile stress (about 1.34×109Pa) distribution along the growth direction of ZnO is revealed by visible Raman mapping spectra. The enhanced significantly high-order longitudinal-optical (LO) phonon modes up to 4th and no TO phonons have been observed in Raman spectrum under UV 325nm by resonance conditions; an intense and broad disorder activated surface phonon mode is also observed, resulting from the increased disorder on the film surface with stripe-like growth features. Low-temperature photoluminescence measurements reveal that the band-edge emission of ZnO is dominated by neutral donor-bound exciton and free electrons to neutral acceptor emissions. Interfacial microstructure of ZnO/GaN has been examined by transmission electron microscopy, with the epitaxial relationship (101¯0) ZnO//(0002¯) GaN. All these results indicated that GaN template played an important role in the growth of ZnO film, with full advantage of small lattice mismatch.
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