2 Gb/s 15 pJ/b/chip Inductive-Coupling Programmable Bus for NAND Flash Memory Stacking
2 Gb/s 15 pJ/b/chip Inductive-Coupling Programmable Bus for NAND Flash Memory Stacking
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用于 NAND 闪存堆叠的 2 Gb/s 15 pJ/b/芯片 电感耦合可编程总线
DOI:
10.1109/jssc.2009.2034431
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发表时间:
2009
期刊:
影响因子:
--
通讯作者:
T. Kuroda
中科院分区:
文献类型:
--
作者:
Mitsuko Saito;Y. Sugimori;Y. Kohama;Y. Yoshida;N. Miura;H. Ishikuro;T. Sakurai;T. Kuroda
A wireless communication technique, which enables a controller chip to communicate with random access with a stack underneath it of 64 NAND Flash memory chips at a data rate of 2Gb/s using relayed transmission is developed (Fig. 13.5.1). This technique can be applied to memory access in solid-state drives (SSD). The wireless interface allows the removal of a highly capacitive ESD protection device and results in a 2× reduction in power consumption, and a 40× reduction in I/O circuit-layout area. Using bonding wires for the power supply and wireless interface for data access reduces the number of bonding wires in the 64-chip stack from over 1,500 wires to less than 200 wires. This reduction in the number of bonding wires makes it possible to integrate 64 chips in one package, which conventionally requires eight separate packages. This wireless interface is based on inductive coupling between inductors on the stacked chips. The inductors emit magnetic field both upwards and downwards. This creates both intentional and unintentional communication link, which makes it difficult to be used in homogeneous stacking. Our technique enables data delivery upwards and downwards for memory read and write with measured BER ≪ 10–12. Power reduction is achieved by proper state programming of individual chips.
DOI:
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发表时间:
2006
期刊:
Technical report of IEICE Vol.106, No.71
影响因子:
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作者:
村山芳隆;小澤哲也;堀越直;薮上信;石山和志;荒井賢一;N.Miura
通讯作者:
N.Miura
DOI:
10.1109/isscc.2004.1332634
发表时间:
2004-09
期刊:
2004 IEEE International Solid-State Circuits Conference (IEEE Cat. No.04CH37519)
影响因子:
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作者:
D. Mizoguchi;Y.B. Yusof;N. Miura;T. Sakura;T. Kuroda
通讯作者:
D. Mizoguchi;Y.B. Yusof;N. Miura;T. Sakura;T. Kuroda
DOI:
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发表时间:
2005
期刊:
Technical report of IEICE Vol.105, No.96
影响因子:
--
作者:
小澤哲也;横田周子;堀越直;藪上信;石山和志;荒井賢一;N.Miura
通讯作者:
N.Miura