Sputter deposited NbCxNy films: Effect of nitrogen content on structure and mechanical and tribological properties
Sputter deposited NbCxNy films: Effect of nitrogen content on structure and mechanical and tribological properties
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溅射沉积 NbCxNy 薄膜:氮含量对结构以及机械和摩擦学性能的影响
DOI:
10.1016/j.surfcoat.2014.07.086
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发表时间:
2014-11
影响因子:
5.4
通讯作者:
Zheng, W.T.
中科院分区:
文献类型:
--
作者:
Zhang, Kan;Wen, M.;Wang, S.;Deng, R.P.;Gall, D.;Zheng, W.T.
NbCxNythin films were deposited on Si(100) substrates by direct current magnetron sputtering from a Nb–C compound target in a mixture of N2and Ar. The mechanical and tribological properties show a significant dependency on composition, chemical bonding and structure, as characterized by X-ray diffraction, and photoelectron and Raman spectroscopies. Increasing the nitrogen flow rate from 0 to 5 to 30 sccm causes a continuous increase of the nitrogen content y from 0 to 0.44 to 1.01. The films exhibit a Nb(C,N) solid solution at low N content, while an additional hexagonal NbN phase develops for y ≥ 0.69. A maximum hardness H = 42.1 GPa and elastic modulus E = 362 GPa is reached for the NbC1.44N0.44film, which also exhibits the highest compressive stress of 6.1 GPa and the highest H3/E2value, yielding the best wear resistance. Increasing the N content leads to an increasing amorphous phase, which ultimately causes a reduction of stress, hardness, H3/E2, and wear resistance. The nitrogen also reduces the root mean square surface roughness from 1.27 to 0.46 nm, and causes a reduction of the friction due to an increase in the sp2-graphitelike carbon phase, with the lowest friction coefficient of 0.18 for the NbC1.99N0.69film.
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DOI:
10.1103/physreve.61.1904
发表时间:
2000-02
期刊:
Physical review. E, Statistical physics, plasmas, fluids, and related interdisciplinary topics
影响因子:
--
作者:
Wang;Cohen;Ruzic;Goeckner
通讯作者:
Wang;Cohen;Ruzic;Goeckner
影响因子:
3.7
作者:
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通讯作者:
V. Ivashchenko;P. Turchi;E. Olifan
影响因子:
2.1
作者:
T. Francavilla;S. Wolf;E. Skelton
通讯作者:
T. Francavilla;S. Wolf;E. Skelton
影响因子:
5.4
作者:
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通讯作者:
E. Silva;M. R. Figueiredo;R. Franz;R. Galindo;C. Palacio;A. Espinosa;C. Mitterer;S. Carvalho
DOI:
10.1016/s0263-4368(99)00008-6
发表时间:
1999-01-01
影响因子:
3.6
作者:
Jindal, PC;Santhanam, AT;Shuster, AF
通讯作者:
Shuster, AF