Review on helium behaviors in nanochannel tungsten film

Review on helium behaviors in nanochannel tungsten film
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纳米通道钨薄膜中氦气行为研究进展

DOI:
10.1007/s42864-021-00097-3
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发表时间:
2021-07
期刊:
Tungsten
影响因子:
--
通讯作者:
Feng Ren
Feng Ren
中科院分区:
其他
文献类型:
--
作者:
Wenjing Qin;Guo Wei;Tao Cheng;Jun Tang;Changzhong Jiang;Feng Ren

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钨(W)作为面向等离子体的材料(PFM)在聚变反应堆中需要面对前所未有的恶劣环境,这对其抗辐射性能提出了很高的要求。在众多挑战中,氦(He)原子的快速积聚形成无数气泡,甚至形成模糊的纳米结构,导致W基体的膨胀和脆化,严重缩短了其使用寿命,这是目前PFM-W面临的最严重的问题之一。本文综述了近年来磁控溅射制备的高表面体积比纳米沟道W膜的研究进展,以及不同聚变辐照环境下He在纳米沟道W膜中的行为。实验和模拟结果表明,纳米沟道W薄膜在管理He行为方面比商用体相W薄膜具有更好的抗辐照性能。
Tungsten (W) as plasma facing material (PFM) needs to face an unprecedented harsh environment in the fusion reactor, which puts forward high requirements for its radiation tolerance. Among the many challenges, the rapid accumulation of helium (He) atoms to form numerous bubbles or even “fuzzy” nanostructure leads to swelling and embrittlement of W matrix and seriously shorten its service life, which is one of the most serious problems faced by PFM-W at present. In this review, we summarize the recent works on the nanochannel W films with high surface-to-volume ratio deposited by magnetron sputtering, and the behaviors of He in the nanochannel W films at different fusion-related irradiation environment. Experimental and simulation results showed that the nanochannel W films have better radiation tolerance performance in managing He behaviors than that of commercial bulk W.
了解氦原子从纳米通道钨中的释放:分子动力学模拟
DOI: 10.1088/1741-4326/ab14c7
发表时间: 2019-06
期刊: Nuclear Fusion
影响因子: 3.3
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影响因子: --
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影响因子: 3.3
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Petty, T. J.;Baldwin, M. J.;Bradley, J. W.
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