Contrast Experiments in Dielectrophoresis Polishing (DEPP)/Chemical Mechanical Polishing (CMP) of Sapphire Substrate
Contrast Experiments in Dielectrophoresis Polishing (DEPP)/Chemical Mechanical Polishing (CMP) of Sapphire Substrate
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蓝宝石衬底介电泳抛光(DEPP)/化学机械抛光(CMP)对比实验
DOI:
10.3390/app9183704
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发表时间:
2019-09
影响因子:
2.7
通讯作者:
Wang Xu
中科院分区:
文献类型:
--
作者:
Zhao Tianchen;Yuan Julong;Deng Qianfa;Feng Kaiping;Zhou Zhaozhong;Wang Xu
The broad applications of sapphire substrates in many fields warrants an urgent demand for a highly efficient and high precision polishing method for the sapphire substrates. The authors proposed a novel sapphire substrate polishing method that is based on the dielectrophoresis (DEP) effect. The principle of dielectrophoresis polishing (DEPP) is described. A non-uniform electric field was added in the polishing area to drive abrasives moving in the direction towards the plate by the DEP force. The amount of abrasives that participates in the polishing action increases as the distribution of polishing slurry on sapphire surface changes, leading towards the improvement of sapphire polishing both in quality and efficiency. Comparative experiments between DEPP and traditional chemical mechanical polishing (CMP) were carried out. It was found that the maximum increase of sapphire MRR for DEPP is 71%, reaching 13 mg/h, and the minimum increase was 9.5%, reaching 4.6 mg/h. The surface roughness of the sapphire substrate decreases faster and more uniform with DEPP. The final surface roughness of the sapphire substrate after DEPP was Ra 0.87 nm and the flatness was 0.3078 waves (RMS value), which is better than 0.6863 waves (RMS value) of sapphire substrate with traditional CMP polishing.
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DOI:
10.1007/s00170-016-8372-3
发表时间:
2016-02
影响因子:
3.4
作者:
Deng, Qianfa;Yuan, Julong;Lyu, Binghai;Lin, Yibo
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影响因子:
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DOI:
10.1002/pssb.200405059
发表时间:
2004-10
期刊:
physica status solidi (b)
影响因子:
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通讯作者:
Y. Cho;Jea-Chul Kim;Young Ju Park;H. Na;H. Kim;Hyun Jin Kim;E. Yoon;Young Woon Kim
影响因子:
1.7
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Liu Ying-ying;Zhu Jun;Luo Wenbo;Hao Lanzhong;Z. Ying;Li Yanrong