Fabrication and characterization of an undoped GaAs/AlGaAs quantum dot device

Fabrication and characterization of an undoped GaAs/AlGaAs quantum dot device
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无掺杂 GaAs/AlGaAs 量子点器件的制备和表征

DOI:
10.1063/1.4900915
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发表时间:
2014-06
影响因子:
3.2
通讯作者:
Guo, Guo-Ping
Guo, Guo-Ping
中科院分区:
物理与天体物理3区
文献类型:
--
作者:
Tu, Tao;Guo, Guang-Can;Jiang, Hong-Wen;Guo, Guo-Ping

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我们展示了一个双量子点的发展与未掺杂的GaAs/AlGaAs异质结使用双顶栅设计制造的集成电荷传感器。基于对集成电荷传感器的评估,双量子点可以被调谐到少电子区域。此外,双量子点的点间耦合可以根据中间栅极上的电压在很大程度上进行调谐。量子点被证明是可调的,从一个单一的点,以及隔离的双点。为了评估这种设计的稳定性,测量了由1/f噪声引起的电势波动。基于本文的研究结果,在未掺杂的GaAs/AlGaAs半导体中开发的量子点设计显示了未来开发纳米器件的潜力。
We demonstrate the development of a double quantum dot with an integrated charge sensor fabricated in undoped GaAs/AlGaAs heterostructures using a double top-gated design. Based on the evaluation of the integrated charge sensor, the double quantum dot can be tuned to a few-electron region. Additionally, the inter-dot coupling of the double quantum dot can be tuned to a large extent according to the voltage on the middle gate. The quantum dot is shown to be tunable from a single dot to a well-isolated double dot. To assess the stability of such design, the potential fluctuation induced by 1/f noise was measured. Based on the findings herein, the quantum dot design developed in the undoped GaAs/AlGaAs semiconductor shows potential for the future exploitation of nano-devices.
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