Fabrication and characterization of an undoped GaAs/AlGaAs quantum dot device
Fabrication and characterization of an undoped GaAs/AlGaAs quantum dot device
复制标题
无掺杂 GaAs/AlGaAs 量子点器件的制备和表征
DOI:
10.1063/1.4900915
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发表时间:
2014-06
影响因子:
3.2
通讯作者:
Guo, Guo-Ping
中科院分区:
文献类型:
--
作者:
Tu, Tao;Guo, Guang-Can;Jiang, Hong-Wen;Guo, Guo-Ping
We demonstrate the development of a double quantum dot with an integrated charge sensor fabricated in undoped GaAs/AlGaAs heterostructures using a double top-gated design. Based on the evaluation of the integrated charge sensor, the double quantum dot can be tuned to a few-electron region. Additionally, the inter-dot coupling of the double quantum dot can be tuned to a large extent according to the voltage on the middle gate. The quantum dot is shown to be tunable from a single dot to a well-isolated double dot. To assess the stability of such design, the potential fluctuation induced by 1/f noise was measured. Based on the findings herein, the quantum dot design developed in the undoped GaAs/AlGaAs semiconductor shows potential for the future exploitation of nano-devices.
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