NOX Reduction Properties of Chromia-doped Tin Oxide and Pla-tinized, Chromia-doped Tin Oxide

氧化铬掺杂氧化锡和镀铂氧化铬氧化锡的NOX还原性能

• 批准号: 8416380
• 负责人: Gar Hoflund
• 金额: --
• 依托单位: University of Florida
• 依托单位国家: 美国
• 项目类别: Continuing grant
• 财政年份: 1985
• 资助国家: 美国
• 起止时间: 1985-07-01 至 1987-12-31
• 项目状态: 已结题
• 来源: https://www.nsf.gov/awardsearch/showAward?AWD_ID=8416380&HistoricalAwards=false
• 关键词: NOX; Reduction; Properties; Chromia; doped

This study attempts to elucidate the properties of chromia-doped tin oxide before and after platinization by probing electronic structure, composition, and geometrical structure using x-ray photoelectron spectroscopy, Auger electron spectroscopy, electron stimulated desorption, and ultraviolet photoelectron spectroscopy. Recent work on chromia-doped tin oxide shows that this material holds promise for treatment of nitrogen oxides. These experiments involve ;itin situ;ro dynamic measurements, the most promising technique for modern catalyst studies. An improved system has been developed for use of an established analytical technique known as Auger spectroscopy. The new system allows more meaningful results than have been possible in the past from this technique which determines kind and amount of compounds present on surfaces. The improved method also allows more sensitive surfaces, not hitherto susceptible to the Auger method, to be analyzed.

本研究试图阐明氧化铬掺杂锡的性质 通过探测电子结构， 用X射线光电子测量组成和几何结构 光谱学，俄歇电子能谱，电子激发 解吸和紫外光电子能谱。 最近的工作 氧化铬掺杂的氧化锡表明，这种材料有望用于 处理氮氧化物。 这些实验包括;它在原位;ro 动态测量，现代催化剂最有前途的技术 问题研究 已经开发了一种改进的系统， 已建立的分析技术称为俄歇光谱。 新 系统允许更有意义的结果比已经可能在 这种技术可以确定化合物的种类和数量 存在于表面上。 改进的方法还允许更灵敏的 表面，迄今为止不受俄歇方法的影响，进行分析。