Presidential Young Investigator Award: Parallel Computing Systems and VLSI Design And Test

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A research program is conducted in parallel computing systems and VLSI design and test. This research project involves two major areas. The primary area concerns algorithms and architectures for parallel processing systems. The secondary area deals with the computer-aided design and testing of VLSI circuits. The work explores the automated design and implementation of multiple processor systems for signal processing and other applications. The focus is on the design of individual special purpose processing elements, as well as the design of the interprocessor interconnection structures. The hardware acceleration of certain computation-intensive CAD algorithms is also investigated. Candidate algorithms include circuit simulation and finite element analysis. Reliability and fault tolerance issues related to these parallel systems are studied. Efforts are underway to develop a new methodology and associated software tools for testing modern MOS VLSI circuits.