US-Brazil Cooperative Research on Characterization of Mixed Oxide Films

该奖项支持由德克萨斯农工大学的Emile Schweikert和D.L.Cocke教授以及巴西里约热内卢天主教大学的Barros Leite、Baptista、Patnaik和Silveira教授对混合氧化物超导薄膜进行的合作研究。这项研究将集中于几种现代分析技术在掺杂阳极薄膜，即在非晶态金属和合金上生长的混合氧化物的表征上的应用。将为这项工作改进和开发的技术包括卢瑟福背散射光谱(RBS)和核反应分析(NRA)。此外，还将开展粒子诱导质谱学的表面表征。这些技术将被用来确定这些薄膜的厚度和组成，这些薄膜具有新颖的催化、耐腐蚀或超导性能。这项工作延续了巴西和美国科学家之间卓有成效的合作。这两个集团的设施和专业知识都做出了贡献，特别是在巴西RBS和NRA新技术的开发以及德克萨斯A&A；得克萨斯州的硕士学生将参加施韦克特对氧化膜的表面和薄层表征的研究，以及科克的样品制备和分析。

This award supports cooperative research on mixed oxide superconducting films to be carried out by Professors Emile Schweikert and D.L. Cocke at Texas A&M University and Professors Barros Leite, Baptista, Patnaik and Silveira at the Pontifical Catholic University in Rio de Janeiro, Brazil. The research will focus on the application of several modern analytical techniques to the characterization of doped anodic films, i.e., mixed oxides grown on amorphous metals and alloys. Techniques which will be refined and developed for this work include Rutherford backscattering spectrometry (RBS) and nuclear reaction analysis (NRA). In addition, surface characterization by particle induced mass spectrometry will be developed. These techniques will be used to determine the thickness and composition of these films that exhibit novel catalytic, resistance to corrosion or superconducting properties. This work continues a very productive collaboration between Brazilian and U.S. scientists. The facilities and expertise of both groups contribute, particularly in the development of the new techniques, RBS and NRA, in Brazil and the sample preparation and analytical support at Texas A&M. Students at Texas will be included in Schweikert's study of the surface and thin layer characterization of the oxide films and in Cocke's sample preparation and analysis.