Studies in Surface and Depth Characterization

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This research project, headed by Professor Emile Schweikert of Texas A&M University, and supported by the Analytical and Surface Chemistry Program, addresses questions of the analysis of solid materials using high energy ion projectiles and thermal neutrons. Measurement of the kinetic energy of recoil nuclei will be used to develop a depth profiling method for the analysis of light elements in solids. Time and spatial correlation counting of secondary ions, electrons, and photons generated by the collision of high energy polyatomic ions with surfaces will be used to study the basic processes of ion-surface interactions. This work promises an increased understanding of the physical interactions underlying the use of ions and thermal neutrons for surface and solid state analytical applications. %%% One of the outstanding problems in solid state materials analysis is the determination of the concentration of light elements as a function of distance from the surface of the solid sample. This research project addresses this problem by developing an analytical technique which uses neutron induced reactions of the light element constituents and kinetic energy measurements of the recoil nuclei produced to obtain depth profiling information. In addition, this project uses related experimental methods to investigate the details of the interaction of high energy polyatomic ions with surfaces, with a view towards the development of improved surface analytical methodology. This work will have wide applicability in the analysis of the surface and bulk composition of materials important in the electronic device industry.