Determination of Surface and Interface Structures by Local and Long-Range Order Diffraction Techniques

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Quantitative knowledge of the structure of surfaces and interfaces is central to the resolution of a host of important scientific questions. This project will use multiple scattering methods for data analysis of diffraction spectroscopies sensitive to the short-range and long-range order of materials. A major focus of our program is to apply these state-of-the-art techniques to study the structure of clean surfaces and that of metastable structures produced in the form of ultra-thin films using epitaxial growth techniques. Results of this work will greatly impact on the area of surface crystallography and the understanding of crystal growth.