Scanning Electron Microscopy for Undergraduate Science and Engineering Education

本科科学与工程教育中的扫描电子显微镜

• 批准号: 8851158
• 负责人: Jefferson Turner
• 金额: $ 6.64万
• 依托单位: University of Massachusetts, Dartmouth
• 依托单位国家: 美国
• 项目类别: Standard Grant
• 财政年份: 1988
• 资助国家: 美国
• 起止时间: 1988-06-01 至 1990-11-30
• 项目状态: 已结题
• 来源: https://www.nsf.gov/awardsearch/showAward?AWD_ID=8851158&HistoricalAwards=false
• 关键词: Scanning; Electron; Microscopy; Undergraduate; Science

Students in biology, electrical engineering and other fields of study learn to use the Scanning Electron Microscope (SEM) for measurements related to their major area of study. A formal course that teaches students the principles of operation and the capabilities of the SEM as well as the procedures for using the instrument is offered on a regular basis. The particular instrument has several features that allow measurements not possible with instruments not possessing these features. After completing the course, the students have access to the SEM for individual project work. The grantee provides funds for this project that are an equal match for the NSF award.

生物、电气工程和其他研究领域的学生学习使用扫描电子显微镜(SEM)进行与其主要研究领域相关的测量。定期开设一门正规课程，向学生传授扫描电子显微镜的操作原理和能力以及使用该仪器的程序。这种特殊的仪器有几个特点，不具备这些特点的仪器不能进行测量。完成课程后，学生可以访问扫描电子显微镜进行单独的项目工作。受赠人为该项目提供的资金与NSF奖相当。