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A machine learning framework for scanning electron diffraction microscopy

A machine learning framework for scanning electron diffraction microscopy
扫描电子衍射显微镜的机器学习框架
批准号:
543431-2019
负责人:
Blackburn, ArthurAM
金额:
$8.74万
依托单位:
依托单位国家:
加拿大
项目类别:
Collaborative Research and Development Grants
财政年份:
2022
资助国家:
加拿大
项目状态:
已结题
起止时间:
2022-01-01 至 2023-12-31

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中文摘要
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英文摘要
Electron microscopy provides atomic resolution images and information from a vast range of materials. The most common electron microscopes scan a focused electron beam over a sample and record indicators of the beam - sample interaction to construct images. Many thousands of these instruments are used globally and are essential for physical and biological sciences, and nano-technology applications. Surprisingly though, these microscopes disregard vast amounts of information on how the beam interacts with the sample on passing through or scattering from the sample. This follows from the limitations of current generation electron detectors. Recently though, these limits have been shattered by the realization of new pixelated detectors that allow formerly discarded diffraction data to be recorded at rates greater than 1000 beam positions per second. This new technique, termed scanning electron diffraction microscopy, gives a step change in the detail and speed of the microscope output from GB to TB of data per day in typical usage. This thousandfold data volume increase leads to remarkable effective resolution improvements and presents exciting possibilities for new characterization methods, which will be developed in this project. However, the increased information output necessitates that new strategies are developed to process, analyse, store and share these results to achieve the maximum impact and potential of this technique. This project will meet this need by applying the power of machine learning to the data and developing an internationally accessible computational framework. This will allow lessons learnt from the research and trained networks to be easily and efficiently shared, reused and refined. The project will apply the framework to yield new insights into materials sciences in Canada, with first applications in defect identification in electronic devices and characterizing polymer and electron beam sensitive devices such as energy storage devices, photovoltaics and nanoparticles for medical diagnostics and treatments. The project will form a Canadian hub for expertise in this rapidly expanding area of electron microscopy, and will strengthen the partner's research, development and product base in Canada.
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  • 批准号:
  • 项目类别:
    省市级项目
  • 资助金额:
    10.0万元
  • 批准年份:
    2022
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  • 依托单位:
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  • 批准号:
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  • 资助金额:
    30万元
  • 批准年份:
    2022
  • 负责人:
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  • 依托单位:
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  • 批准年份:
    2020
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