Development of Instrumentation for Fundamental Studies of Thin Film Magnetism

本研究计划的目标是开发和改进一种用于外延磁性薄膜研究的仪器。相变测量将用于确定薄膜的临界指数。该小组正致力于通过研究原子级结构和磁性之间的关系来修改影响材料磁性行为的物质的物理性质。正在开发的仪器将结合两种互补的自旋敏感光谱技术(克尔效应和自旋极化的二次电子发射)与分子束外延和薄膜结构分析能力(斑点轮廓分析、LEED和电子前向散射光谱)。在一个单独的系统上进行的扫描隧道显微镜将被用来表征衬底。

The goal of this research program is to develop and refine an instrument for the study of epitaxial magnetic thin films. Phase transition measurements will be used to determine the critical exponents of the films. This group is working to modify the physical properties of matter that affect the magnetic behavior of materials through a study of the relation between atomic level structure and magnetism. The instrument being developed will combine two complementary spin-sensitive spectroscopic techniques (Kerr effect and spin-polarized secondary electron emission) with MBE and thin film structure analysis capabilities (spot-profile analysis LEED and electron forward scattering spectroscopy). Scanning tunneling microscopy carried out on a separate system will be used to characterize the substrates.