RUI: The Surface and Electronic Properties of the Zirconium-Boron System

这是本科院校研究项目下的一个奖项。本研究的目的是研究硼化锆体系的表面和电子性能。单晶样品是用电弧诱导区熔炼技术生长的。扫描俄歇光谱法用于测定表面的化学成分。热离子投影显微镜用于测量各种晶体平面的功函数。采用x射线光电子能谱法测定电子能带结构。正在模拟这些材料的功函数。目前高度重视培养本科生，以便将来从事研究生教育和研究工作。

This is an award under the Research at Undergraduate Institutions program. The objective of the research is the investigation of the surface and electronic properties of zirconium boride system. Single crystal specimens are being grown by an arc-induced zone melting technique. Scanning Auger spectrometry is used to determine the chemical composition of the surfaces. Thermionic projection microscopy is used to measure work function of the various crystallographic planes. X-ray photoelectron spectroscopy is used to determine the electronic band structure. The work function of these materials is being modelled. A high emphasis is being placed on the training of undergraduate students for future careers in graduate education and research.