Preparation and Characterization of Oxide and Sulfide Thin Films

氧化物和硫化物薄膜的制备和表征

• 批准号: 9016302
• 负责人: Aaron Wold
• 金额: $ 35.41万
• 依托单位: Brown University
• 依托单位国家: 美国
• 项目类别: Continuing Grant
• 财政年份: 1991
• 资助国家: 美国
• 起止时间: 1991-06-01 至 1994-11-30
• 项目状态: 已结题
• 来源: https://www.nsf.gov/awardsearch/showAward?AWD_ID=9016302&HistoricalAwards=false
• 关键词: Preparation; Characterization; Oxide; Sulfide; Thin

This renewal proposal will apply a novel technique of spray pyrolysis of molecular precursors to the preparation of thin films of oxides and sulfides on various substrates. The technique, developed by the Principal Investigator, will be applied to chromium oxide, gallium oxide, and zirconium oxide, and to zinc sulfide and zinc selinide doped with various magnetic ions. Physical characterization of the films will include optical microscopy, electron and x-ray diffraction and electronic resistivity measurements. Chemical characterization will include a study of stability towards oxidation and/or reduction, and a correlation of properties exhibited by the films and bulk materials of corresponding compositions.

这项更新建议将采用一种新的喷雾技术， 分子前体的热解制备薄膜 氧化物和硫化物在各种基板上。 技术， 由主要研究者制定，将应用于 氧化铬、氧化镓和氧化锆，以及锌 硫化物和硒化锌。 薄膜的物理特性将包括光学特性 显微镜，电子和X射线衍射和电子 电阻率测量 化学表征将包括 对氧化和/或还原稳定性的研究，以及 薄膜和块体材料表现出的性能的相关性 对应的组合物。