Acquisition of High-Resolution Transmission Electron Microscope

这种高分辨率透射电子显微镜提供0.18 侧入级结构中的纳米点分辨率 并且还容纳大立体角X射线检测器。 它 将被安置在学院的新材料科学中心 威斯康星州大学的工程学教授， 新的机会，并加强在几个主要活动 研究领域包括快速基础研究 固化，地质材料的高分辨率成像， 低温和高温超导材料 砷化镓上的金属化，开发，负载金属 催化剂，超细陶瓷颗粒和膜， 结构玻璃陶瓷的结晶化和辐射 聚变系统和等离子体源离子材料的损伤 植入加工。

This high-resolution transmission electron microscope offers 0.18 nanometer point resolution in a side-entry stage configuration and also accommodates a large solid angle x-ray detector. It will be housed in the new Materials Science Center of the College of Engineering at the University of Wisconsin, and will create new opportunities and enhance the activities in several major research areas including fundamental studies of rapid solidification, high-resolution imaging of geological materials, low-temperature and high-temperature superconducting materials development, metallizations on gallium-arsenide, supported metal catalysts, ultrafine ceramic particles and membranes, crystallization of structural glass ceramics, and radiation damage in materials for fusion systems and plasma-source ion implantation processing.