RUI: Surface Roughness Studies Using the Scanning Tunnel Microscope

RUI：使用扫描隧道显微镜研究表面粗糙度

• 批准号: 9110746
• 负责人: Patricia Allen
• 金额: $ 7万
• 依托单位: Appalachian State University
• 依托单位国家: 美国
• 项目类别: Standard Grant
• 财政年份: 1991
• 资助国家: 美国
• 起止时间: 1991-08-01 至 1994-01-31
• 项目状态: 已结题
• 来源: https://www.nsf.gov/awardsearch/showAward?AWD_ID=9110746&HistoricalAwards=false
• 关键词: RUI; Surface; Roughness; Studies; Using

This project is to establish a Scanning Tunnel/Atomic Force Microscopy (STM/AFM) program at Appalachian State University. This program will be used as a teaching tool for undergraduates and will provide research opportunities for both undergraduate and graduate students in Applied Physics. The research projects will focus on the surface characterization of materials provided by Dr. Phil Russell as a collaborative effort between ASU and the Precision Engineering Center at North Carolina State University. The STM will be used to study three specific areas: surface roughness of metal overlayers, optical component quality, and nanometer metallization. The STM is a surface analysis tool which is limited to the study of conducting samples. The surface roughness of thin metal overlayers on insulators will be examined in an attempt to find materials which: form a uniform overlayer; can be studied with the STM; and preserve the insulator surface topography. Surface roughness studies can also be used to provide insight into the processing of high quality optical insight into the processing of high quality optical components, which often requires surface features to be less than a few atomic units. Lastly, nanometer metallization of silicon will be explored by using a low energy (-10eV) beam from the STM to dissociate PD from Pd-Ac thin films.

该项目旨在建立一个扫描 隧道/原子力显微镜（STM/AFM） 阿巴拉契亚州立大学的一个项目。 这 程序将被用作教学工具， 本科生，并将提供研究 本科生和研究生的机会 应用物理学的学生。 研究项目将集中在表面 Phil博士提供的材料表征 罗素作为亚利桑那州立大学和 位于北卡罗来纳州的精密工程中心 州立大学。 STM将用于研究 三个具体方面：金属表面粗糙度 覆盖层、光学元件质量，以及 纳米金属化 STM是一种表面分析工具， to the study研究of conducting导电samples样品. 表面 绝缘体上的薄金属覆盖层的粗糙度将 进行审查，以试图找到材料，其中： 形成均匀的覆盖层;可以用 STM;并保留绝缘体表面 地形表面粗糙度研究也可以 用于提供对高性能 高品质光学洞察加工 质量光学元件，这往往需要 表面特征小于几个原子单位。 最后，硅的纳米金属化将是 探索通过使用低能量（-10eV）光束从 STM将Pd从Pd-Ac薄膜中解离出来。