RUI: Surface Roughness Studies Using the Scanning Tunnel Microscope

本项目是在阿巴拉契亚州立大学建立扫描隧道/原子力显微镜（STM/AFM）项目。该项目将作为本科生的教学工具，并将为应用物理学的本科生和研究生提供研究机会。研究项目将集中在菲尔·罗素博士提供的材料的表面表征上，这是亚利桑那州立大学和北卡罗莱纳州立大学精密工程中心之间的合作成果。STM将用于研究三个特定领域：金属覆盖层的表面粗糙度，光学元件质量和纳米金属化。STM是一种表面分析工具，仅限于导电样品的研究。将检查绝缘子上薄金属覆盖层的表面粗糙度，以试图找到：形成均匀覆盖层的材料；可以用STM进行研究；并保持绝缘体表面形貌。表面粗糙度研究也可用于提供对高质量光学元件加工的深入了解，这通常要求表面特征小于几个原子单位。最后，利用STM的低能（-10eV）光束将PD从PD - ac薄膜中分离出来，探索硅的纳米金属化。

This project is to establish a Scanning Tunnel/Atomic Force Microscopy (STM/AFM) program at Appalachian State University. This program will be used as a teaching tool for undergraduates and will provide research opportunities for both undergraduate and graduate students in Applied Physics. The research projects will focus on the surface characterization of materials provided by Dr. Phil Russell as a collaborative effort between ASU and the Precision Engineering Center at North Carolina State University. The STM will be used to study three specific areas: surface roughness of metal overlayers, optical component quality, and nanometer metallization. The STM is a surface analysis tool which is limited to the study of conducting samples. The surface roughness of thin metal overlayers on insulators will be examined in an attempt to find materials which: form a uniform overlayer; can be studied with the STM; and preserve the insulator surface topography. Surface roughness studies can also be used to provide insight into the processing of high quality optical insight into the processing of high quality optical components, which often requires surface features to be less than a few atomic units. Lastly, nanometer metallization of silicon will be explored by using a low energy (-10eV) beam from the STM to dissociate PD from Pd-Ac thin films.