U.S.-Australia Cooperative Research in X-ray Studies of ThinFilms and Artificial Multilayers

该奖项支持西蒙·C博士在第一年的一次访问。 莫斯和一个由博士后研究员P.C.周先生， 休斯顿大学，大学公园，和一个每个在 第二年，到澳大利亚维多利亚克莱顿的CSIRO工作， Stephen W.材料科学部的威尔金斯和 材料科学与技术系 薄膜的X射线微结构表征， 用各种方法制造的多层半导体。 的 研究人员打算选择一些材料进行深入研究 并结合各自的工具和理论技能， 开发新的见解和分析方法。 研究课题 包括：（1）半导体多层（超晶格）结构; (2)非相干结构中界面的研究;（3） 有序化、振动效应和局域化的研究 多层和薄膜结构内的畸变。 的 三个主题在某种程度上是相互关联的，因为它们需要非常 仔细注意数据收集和散射理论。

This award supports one visit in the first year by Dr. Simon C. Moss, and one by post-doctoral researcher P.C. Chow, of the University of Houston, University Park, and one each in the second year, to CSIRO, Clayton, Victoria, Australia, to work with Dr. Stephen W. Wilkins of the Division of Materials Science and Technology on the Division of Materials Science and Technology on the x-ray microstructural characterization of thin films and multilayers of semiconductors produced by various means. The researchers intend to select a few materials for intensive study and join their respective instrumental and theoretical skills to develop new insights and analytical methods. The research topics include: (1) semiconductor multilayer (superlattice) structures; (2) studies of interfaces in incoherent structures; and (3) studies of ordering, vibrational effects and localized distortions within multilayer and thin-film structures. The three topics are somewhat interrelated in that they require very careful attention to data collection and to scattering theory.