FTIR Microscopy in Undergraduate Materials Engineering Laboratories

本专题主要介绍傅立叶变换 红外（FTIR）显微镜在本科材料 工程课程 FTIR光谱仪和FTIR 显微镜已被证明是广泛的分析工具， 应用范围;然而，该技术的实用性 用于材料分析和表征的技术 工程师的注意 几个实验已经 开发以突出基本原理，如吸附和 金属表面的腐蚀，共价金属键合， 沉积在半导体上的氧化物薄膜的表征 金属表面，集成电路的表征，以及 聚合物和涂层的表征。

This project focuses on the introduction of Fourier transform infrared (FTIR) microscopy in the undergraduate materials engineering curriculum. The FTIR Spectrometer and FTIR microscope have proven value as analytical tools in a wide range of applications; however, the utility of the technique for materials analysis and characterization has received little attention from engineers. Several experiments have been developed to highlight basic principles such as adsorption and corrosion on metal surfaces, covalent metallic bonding, characterization of thin oxide films deposited on semiconductor metal surfaces, characterization of integrated circuits, and characterization of polymers and coatings.