Improvement of Reliability of Electronic Subsystems

提高电子子系统的可靠性

• 批准号: 9253013
• 负责人: Steven Castillo
• 金额: $ 22万
• 依托单位: New Mexico State University
• 依托单位国家: 美国
• 项目类别: Continuing Grant
• 财政年份: 1992
• 资助国家: 美国
• 起止时间: 1992-10-01 至 1996-03-31
• 项目状态: 已结题
• 来源: https://www.nsf.gov/awardsearch/showAward?AWD_ID=9253013&HistoricalAwards=false
• 关键词: Improvement; Reliability; Electronic; Subsystems

Electronic systems based on Very Large Scale Integration (VLSI) have become increasingly complex. Evolutionary and revolutionary advances in process control, CAD layout software, and semiconductor device physics have allowed circuit designers to place an ever increasing number of devices on a single chip. In addition, the band width Hx VLSI circuits is increasing as well. All these advances have led to increasing problems with reliability and testability of VLSI circuits. The proposal addresses the problems of reliability and testability of VLSI circuits. The research program will continue ongoing research in the analysis of electronic performance of VLSI circuits and in the design and implementation of on-chip test and analysis circuits. In addition, the proposal addresses the problem of VLSI circuit failure due to ionizing radiation. The project will support the training of minority graduate students in this important area over a three year period.

基于超大规模集成电路的电子系统 （VLSI）变得越来越复杂。 进化 以及在过程控制、CAD布局 软件和半导体器件物理已经允许 电路设计师将越来越多的 单个芯片上的器件。 此外，带宽Hx 超大规模集成电路也在增加。 所有这些进步 导致了可靠性问题的增加， 超大规模集成电路的可测试性。 该建议涉及可靠性问题， VLSI电路的可测试性。 该研究计划将 继续进行电子分析研究， 超大规模集成电路的性能和在设计和 实现片上测试和分析电路。 在 此外，该建议还解决了超大规模集成电路的问题， 电离辐射导致的电路故障 该项目将支持培训少数民族 研究生在这一重要领域超过三个 年期间。