Acquisition of Intergrated Analytical SEM: X-ray Image Analysis System

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9314620 COWEN A state-of-the-art, fully integrated analytical scanning electron microscope will be purchased for high resolution imaging in conjunction with rapid and versatile elemental chemical phase and digital imaging microanalysis. The school of Ocean and Earth Science and Technology has added many new faculty in the last few years which have placed increasingly sophisticated demands on our current instrumentation. The new analytical SEM system would provide: 1. simultaneous optimal imaging and x-ray detection, 2. superior secondary and back scattered electron high resolution imaging, 3. very high beam stability, 4. advanced computer array (fast processor, large storage capacity) for efficient data/image collection, processing and storage, 5. excellent stage automation for high volume particle field analysis. The instrument will directly and immediately benefit the diverse NSF-sponsored research programs active within the Departments Oceanography, and Geology and Geophysics and the Hawaii Institute of Geophysics.