SGER: Polarization Near-Field Scanning Optical Microscopy of Ordered Polymers

SGER：有序聚合物的偏振近场扫描光学显微镜

• 批准号: 9315676
• 负责人: Richard Spontak
• 金额: $ 5万
• 依托单位: North Carolina State University
• 依托单位国家: 美国
• 项目类别: Standard Grant
• 财政年份: 1993
• 资助国家: 美国
• 起止时间: 1993-08-15 至 1995-01-31
• 项目状态: 已结题
• 来源: https://www.nsf.gov/awardsearch/showAward?AWD_ID=9315676&HistoricalAwards=false
• 关键词: SGER; Polarization; Near; Field; Scanning

9315676 Spontak The resolution of a conventional optical microscope, limited by diffraction in the "far-field," is dictated by the wavelength of the electromagnetic radiation employed. Recent studies have successfully demonstrated that a microscope based on a drawn optical fiber and operated within very close proximity to a specimen (in the "near-field") is limited by the size of the probe (to ca. 20 nm) and not by considerations. In this work, we will carry out an exploratory program in which polarization near-field scanning optical microscopy (PNSOM) is developed and applied as a novel characterization technique to determine the spatial distribution of local molecular organization (through birefringence) in a variety of ordered polymeric materials. Several systems will be targeted for initial studies in this program. Local birefringence in a liquid crystal/polymer emulsion (for electro-optical applications) would provide information regarding molecular organization at the crystal/polymer interface. In-situ studies of thermotropic and lyotropic polymers will permit determination of local supramolecular organization preceding mesophase formation and reorganization accompanying thermal treatment. While these systems will be the focus of our initial studies, we foresee PNSOM as a high-resolution imaging technique promising to prove beneficial in studies involving crystallization, surface orientation, localized stress, and phase compatibilization. This technique is non-destructive and does not require the capital, maintenance, and high-vacuum needed by several high-resolution imaging techniques. ***

9315676 Spontak 传统光学显微镜的分辨率受到“远场”衍射的限制，由所使用的电磁辐射的波长决定。 最近的研究成功证明，基于拉制光纤并在非常接近样本（“近场”）的情况下操作的显微镜受到探头尺寸（约 20 nm）的限制，而不是受到考虑因素的限制。 在这项工作中，我们将开展一项探索性计划，其中开发并应用偏振近场扫描光学显微镜（PNSOM）作为一种新颖的表征技术，以确定各种有序聚合物材料中局部分子组织（通过双折射）的空间分布。 该计划将针对多个系统进行初步研究。 液晶/聚合物乳液（用于电光应用）中的局部双折射将提供有关晶体/聚合物界面处分子组织的信息。 热致聚合物和溶致聚合物的原位研究将允许确定中间相形成之前的局部超分子组织以及伴随热处理的重组。 虽然这些系统将是我们初步研究的重点，但我们预计 PNSOM 作为一种高分辨率成像技术，有望在涉及结晶、表面取向、局部应力和相相容性的研究中证明是有益的。 该技术是非破坏性的，不需要多种高分辨率成像技术所需的资金、维护和高真空。 ***