Scanning Tunneling Microscope Instrumentation for Introductory Electronics and Materials Characterization Courses

用于入门电子和材料表征课程的扫描隧道显微镜仪器

• 批准号: 9350914
• 负责人: Richard Superfine
• 金额: $ 1.93万
• 依托单位: University of North Carolina at Chapel Hill
• 依托单位国家: 美国
• 项目类别: Standard Grant
• 财政年份: 1993
• 资助国家: 美国
• 起止时间: 1993-04-15 至 1996-03-31
• 项目状态: 已结题
• 来源: https://www.nsf.gov/awardsearch/showAward?AWD_ID=9350914&HistoricalAwards=false
• 关键词: Scanning; Tunneling; Microscope; Instrumentation; Introductory

Courses Scanning tunneling microscope technology (STM) is being used as a unifying project in our introductory electronics course and as a bridge to our laboratory course in materials characterization techniques. By having the students build an STM and the compare their homebuilt version with a commercial unit, we address two major problems endemic to electronics courses: the failure to truly interest students in the wide range of circuit techniques presented and the lack of student exposure to the full scope of a complex design project. We have chosen the STM because of its intuitive appeal and range of applications engage our students who come from a variety of scientific backgrounds. We are building 13 scanning tunneling microscope workstations, each consisting of several separate circuit modules. In weekly laboratory sessions students breadboard and study the circuits in each module, then interconnect previously built units to make a working STM. The classroom lectures use the performance requirements of the STM project as a guide to exploring component and circuit specifications. We have purchased a commercial instructional STM which the students use after they have demonstrated their homebuilt version. They gain an appreciation of the results of the development efforts of an expert team and come to understand that a complex instrument is composed of simpler subunits. Most students who take the electronics course subsequently take the materials characterization laboratory course. They study the physics of scanning tunneling microscopy in experiments using the commercial STM, which complements present experiments in x-ray diffraction and scanning electron microscopy. This is excellent preparation for independent research projects with active graduate research programs in scanning probe microscopies. Students pursuing these courses have thorough knowledge of a state-of-the-art instrument and technique which gives them confidence to master any technology they will encounter in the future.

课程扫描隧道显微镜技术（STM）是 在我们的介绍中被用作统一项目 电子课程，并作为桥梁，我们的实验室课程， 材料表征技术。 通过让学生们 构建一个STM，并将其自制版本与 商业单位，我们解决两个主要问题的地方， 电子课程：未能真正引起学生的兴趣， 广泛的电路技术提出和缺乏 学生接触到一个复杂的设计项目的全部范围。 我们选择STM是因为它直观的吸引力， 一系列的应用程序吸引我们的学生谁来自 各种科学背景。 我们正在建造13个扫描 隧道显微镜工作站，每个工作站由多个 分离的电路模块。 在每周的实验室会议中 学生在试验板上学习每个模块中的电路，然后 将先前构建的单元互连以形成工作STM。 的 课堂讲授使用STM的性能要求 项目作为探索元件和电路的指南 规范. 我们已经购买了一个商业指导 学生们在展示了他们的 自制版本。 他们获得了一个欣赏的结果， 专家团队的开发努力， 我明白一个复杂的仪器是由更简单的 亚单位。 大多数修电子学的学生 随后将材料表征实验室 当然了 他们研究扫描隧道的物理学 使用商业STM的实验中的显微镜， 补充了目前的X射线衍射实验， 扫描电镜 这是极好的准备 为独立的研究项目与积极的研究生研究 扫描探针显微镜的程序。 学生追求 这些课程对最先进的 工具和技术，让他们有信心掌握 他们在未来会遇到的任何技术。