Logic Analysis System for IC Component Testing

IC元件测试逻辑分析系统

• 批准号: 9350965
• 负责人: Christopher Carroll
• 金额: $ 2.21万
• 依托单位: University of Minnesota-Twin Cities
• 依托单位国家: 美国
• 项目类别: Standard Grant
• 财政年份: 1993
• 资助国家: 美国
• 起止时间: 1993-04-15 至 1995-09-30
• 项目状态: 已结题
• 来源: https://www.nsf.gov/awardsearch/showAward?AWD_ID=9350965&HistoricalAwards=false
• 关键词: Logic; Analysis; System; IC; Component

With the potential for tens of millions of transistors enclosed within a package that grants only limited access to the internal circuitry, it is a challenge to determine whether a modern integrated circuit is fully functional. The Computer Engineering Department at the University of Minnesota, Duluth, is introducing a VLSI circuit design class in the Fall of 1993, and faces the task of testing the integrated circuits that students design. This project is adding a Logic Analysis System to an existing data acquisition lab to form a test station for functionally testing and characterizing digital integrated circuits. The existing data acquisition equipment, acquired through a prior NSF-ILI grant in 1988, is serving as the foundation for the test station, providing control functions and analog stimulus and measurement capabilities. The new equipment is adding the capability of exercising the device under test with a stream of test vectors and capturing its response at high speed. With NSF's help, this new equipment is enhancing the function of the existing NSF-supported data acquisition equipment to form a complete test station for testing and characterizing students' digital integrated circuit designs. The addition of this equipment is enabling development of a future course on techniques for testing and design for testability ideas.

它可以容纳数千万个晶体管 在一个只赠款有限访问 内部电路，这是一个挑战，以确定是否 现代集成电路功能齐全。计算机 明尼苏达大学工程系，杜卢斯， 1993年秋季推出了超大规模集成电路设计课程， 并面临着测试集成电路的任务， 学生设计。这个项目增加了一个逻辑分析系统 到现有的数据采集实验室，形成一个测试站， 数字集成电路的功能测试和特性分析 电路.现有的数据采集设备， 通过1988年的NSF-ILI赠款， 试验站的基础，提供控制功能 以及模拟激励和测量能力。新 设备正在增加锻炼设备的能力， 在测试中使用测试向量流并捕获其 快速响应。在NSF的帮助下，这种新设备 增强现有NSF支持数据的功能 采集设备，形成一个完整的测试站， 测试和表征学生的数字集成电路 的设计.这些设备的增加使发展 未来的测试和设计技术课程， 可测试性思想。