Purchase of a Scanning Probe Microscope

购买扫描探针显微镜

• 批准号: 9419335
• 负责人: John Birks
• 金额: $ 8.56万
• 依托单位: University of Colorado at Boulder
• 依托单位国家: 美国
• 项目类别: Standard Grant
• 财政年份: 1994
• 资助国家: 美国
• 起止时间: 1994-12-15 至 1995-11-30
• 项目状态: 已结题
• 来源: https://www.nsf.gov/awardsearch/showAward?AWD_ID=9419335&HistoricalAwards=false
• 关键词: Purchase; Scanning; Probe; Microscope

This award from the Chemistry Research Instrumentation and Facilities program is to aid the Department of Chemistry at University of Colorado at Boulder in the purchase of a scanning probe microscope (SPM). This instrument will be used in the following research programs: 1) Heteroepitaxial 2-D crystals on highly oriented pyrolytic graphite which grow under liquid crystal films; and Self-assembled monolayers on glass. 2) Synthesis and topographic characterization by SPM of chemically deposited films. The scanning probe microscope (SPM) enables researchers to image atoms directly. The technique uses the piezoelectric effect which involves bringing an extremely sharp metal needle within a few angstroms of the samples surface. The distance is small enough for electrons to leak or tunnel across the gap and generate a minute current. As the gap between the tip and the sample increases, the current decreases. As the probe crosses the sample, moving back and forth across its surface, the probe traces out a contour map of the sample's surface atoms. The SPM is used in the control of material used to fabricate semiconductor circuits.

该奖项来自化学研究仪器和设施计划，旨在帮助科罗拉多大学博尔德分校化学系购买扫描探针显微镜 (SPM)。 该仪器将用于以下研究项目： 1）在液晶薄膜下生长的高取向热解石墨异质外延二维晶体；以及玻璃上的自组装单层膜。 2）化学沉积薄膜的SPM合成和形貌表征。 扫描探针显微镜 (SPM) 使研究人员能够直接对原子进行成像。 该技术利用压电效应，将极其锋利的金属针置于距离样品表面几埃的范围内。 该距离足够小，电子可以泄漏或穿过间隙并产生微小电流。 随着尖端和样品之间的间隙增大，电流减小。 当探针穿过样品并在其表面来回移动时，探针会绘制出样品表面原子的轮廓图。 SPM 用于控制用于制造半导体电路的材料。