Purchase of a Scanning Probe Microscope

该奖项来自化学研究仪器和设施项目，旨在帮助科罗拉多大学博尔德分校化学系购买扫描探针显微镜（SPM）。该仪器将用于以下研究项目：1)在液晶膜下生长在高取向热解石墨表面的异质外延二维晶体；和玻璃上的自组装单层。2)化学沉积薄膜的合成及其形貌表征。扫描探针显微镜（SPM）使研究人员能够直接对原子成像。该技术利用压电效应，将一根非常锋利的金属针插入到距离样品表面几埃的地方。这个距离足够小，电子可以漏出或穿过间隙，产生微小的电流。随着尖端与样品之间的间隙增大，电流减小。当探针穿过样品，在样品表面来回移动时，探针会绘制出样品表面原子的等高线图。SPM用于控制用于制造半导体电路的材料。

This award from the Chemistry Research Instrumentation and Facilities program is to aid the Department of Chemistry at University of Colorado at Boulder in the purchase of a scanning probe microscope (SPM). This instrument will be used in the following research programs: 1) Heteroepitaxial 2-D crystals on highly oriented pyrolytic graphite which grow under liquid crystal films; and Self-assembled monolayers on glass. 2) Synthesis and topographic characterization by SPM of chemically deposited films. The scanning probe microscope (SPM) enables researchers to image atoms directly. The technique uses the piezoelectric effect which involves bringing an extremely sharp metal needle within a few angstroms of the samples surface. The distance is small enough for electrons to leak or tunnel across the gap and generate a minute current. As the gap between the tip and the sample increases, the current decreases. As the probe crosses the sample, moving back and forth across its surface, the probe traces out a contour map of the sample's surface atoms. The SPM is used in the control of material used to fabricate semiconductor circuits.