Purchase of a Scanning Probe Microscope

来自化学研究仪器和设施项目的这一奖项是为了帮助科罗拉多大学博尔德分校化学系购买扫描探针显微镜(SPM)。该仪器将用于以下研究项目：1)生长在液晶薄膜下的高度定向热解石墨上的异质外延2-D晶体；以及玻璃上的自组装单分子膜。2)化学沉积薄膜的制备及SPM形貌表征。扫描探针显微镜(SPM)使研究人员能够直接对原子成像。这项技术利用了压电效应，将一根非常锋利的金属针带到样品表面的几埃范围内。距离足够小，电子可以泄漏或通过隧道穿过缝隙，产生微小的电流。随着针尖和样品之间的间隙增加，电流减小。当探测器穿过样品，在样品表面来回移动时，探测器会绘制出样品表面原子的等高线图。SPM用于控制用于制造半导体电路的材料。

This award from the Chemistry Research Instrumentation and Facilities program is to aid the Department of Chemistry at University of Colorado at Boulder in the purchase of a scanning probe microscope (SPM). This instrument will be used in the following research programs: 1) Heteroepitaxial 2-D crystals on highly oriented pyrolytic graphite which grow under liquid crystal films; and Self-assembled monolayers on glass. 2) Synthesis and topographic characterization by SPM of chemically deposited films. The scanning probe microscope (SPM) enables researchers to image atoms directly. The technique uses the piezoelectric effect which involves bringing an extremely sharp metal needle within a few angstroms of the samples surface. The distance is small enough for electrons to leak or tunnel across the gap and generate a minute current. As the gap between the tip and the sample increases, the current decreases. As the probe crosses the sample, moving back and forth across its surface, the probe traces out a contour map of the sample's surface atoms. The SPM is used in the control of material used to fabricate semiconductor circuits.