Assessing image quality improvement of a new Scanning Probe Microscopy imaging mode.

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Nanosurf, an established but fast growing Scanning Probe Microscope manufacturer, has developed a new surface imaging mode that appears to both increase both imaging resolution and the lifespan of the imaging probes used during scanning. As this microscope is working down to the atomic scale specialized facilities would be required to monitor such changes in a quantifiable way. The aim of the project is to test this observation in a metrological manner, by partnering with the National Physical Laboratory (NPL) in order to develop a protocol to quantifiably measure resolution changes over time as the tip wears.